BS EN 62391-1:2016:2019 Edition
$198.66
Fixed electric double-layer capacitors for use in electric and electronic equipment – Generic specification
| Published By | Publication Date | Number of Pages |
| BSI | 2019 | 64 |
This part of IEC 62391 applies to fixed electric double-layer capacitors (hereafter referred to as capacitor(s)) mainly used in d.c. circuits of electric and electronic equipment.
This part of IEC 62391 establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | National foreword |
| 7 | English CONTENTS |
| 12 | FOREWORD |
| 14 | 1 Scope 2 Normative references |
| 15 | 3 Terms and definitions |
| 19 | 4 General items 4.1 Unit and symbols 4.2 Preferred values and class 4.2.1 General |
| 20 | 4.2.2 Preferred values of nominal capacitance 4.2.3 Class 4.3 Marking 4.3.1 General 4.3.2 Coding 4.4 Quality assessment procedures 5 Tests and measurement 5.1 General 5.2 Test and measurement requirements 5.2.1 Test conditions 5.2.2 Measurement conditions |
| 21 | 5.2.3 Voltage treatment 5.2.4 Thermal treatment 5.3 Drying 5.4 Visual examination and check of dimensions 5.4.1 Visual examination 5.4.2 Dimensions (gauging) 5.4.3 Dimensions (detail) 5.5 Measurement method 1 for capacitance and internal resistance (constant current discharge) 5.5.1 Basic circuit for measuring |
| 22 | 5.5.2 Measuring equipment Figures Figure 1 − Basic circuit for measuring |
| 23 | 5.5.3 Measuring procedure Figure 2 – Voltage–time characteristics between capacitor terminalsin capacitance and internal resistance measurement |
| 24 | Tables Table 1 – Measuring conditions for measuring method 1A |
| 25 | 5.5.4 Calculation methods for capacitance Table 2 – Measuring conditions for measuring method 1B |
| 26 | 5.5.5 Calculation methods for internal resistance |
| 27 | 5.5.6 Conditions to be prescribed in the detail specification 5.6 Measurement method 2 for capacitance and internal resistance 5.6.1 Constant resistance charging method for capacitance measurement Figure 3 − Circuit for constant resistance charging method |
| 28 | 5.6.2 AC internal resistance measuring method 5.7 Leakage current 5.7.1 Measuring method Figure 4 − Circuit for a.c. resistance method |
| 29 | 5.7.2 Items to be specified in the detail specification 5.8 Maintain voltage 5.8.1 Measuring method Figure 5 − Maintain voltage test diagram |
| 30 | 5.8.2 Calculation of voltage maintenance rate 5.8.3 Conditions to be prescribed in the detail specification 5.9 Robustness of terminations 5.9.1 Test Ua1 – Tensile 5.9.2 Test Ub – Bending (half of the sample) Table 3 – Tensile force |
| 31 | 5.9.3 Test Uc – Torsion (remaining sample) 5.9.4 Test Ud – Torque (for terminations with threaded studs or screws and for integral mounting devices) 5.9.5 Visual examination 5.10 Resistance to soldering heat 5.10.1 Preconditioning and initial measurement 5.10.2 Test 5.10.3 Recovery Table 4 – Torque |
| 32 | 5.10.4 Final inspection, measurements and requirements 5.11 Solderability 5.11.1 General 5.11.2 Preconditioning 5.11.3 Capacitors with leads |
| 33 | 5.11.4 Surface mount capacitors 5.12 Rapid change of temperature 5.12.1 Initial measurement 5.12.2 Test 5.12.3 Final inspection, measurements and requirements 5.13 Vibration 5.13.1 Initial measurement 5.13.2 Test |
| 34 | 5.13.3 Final measurement and requirements 5.14 Damp heat, steady state 5.14.1 Initial measurement 5.14.2 Test 5.14.3 Final measurement 5.15 Endurance 5.15.1 Initial measurements 5.15.2 Test 5.15.3 Final measurement, inspection and requirements |
| 35 | 5.16 Storage 5.16.1 Storage at high temperature 5.16.2 Storage at low temperature 5.17 Characteristics at high and low temperature 5.17.1 General 5.17.2 Test procedure |
| 36 | 5.17.3 Dry heat 5.17.4 Cold 5.17.5 Final measurement and requirements 5.18 Component solvent resistance 5.18.1 Initial measurements 5.18.2 Test 5.18.3 Requirements 5.19 Solvent resistance of marking 5.19.1 Test |
| 37 | 5.19.2 Requirements 5.20 Passive flammability 5.20.1 Test procedure 5.20.2 Requirements 5.21 Pressure relief (if applicable) 5.21.1 Test 5.21.2 Requirements Table 5 – Severities and requirements |
| 38 | Annex A (normative)Classification according to capacitance and internal resistance A.1 General A.2 Classification by capacitance and internal resistance |
| 39 | Figure A.1 – Conceptual rendering orientated by characteristics in each classification Table A.1 – Electrical performance and measuring method by class |
| 40 | Annex B (informative)Measuring method of capacitance and low resistanceby low frequency a.c. method (reference) B.1 General B.2 Measuring system B.3 Calculation of capacitance Figure B.1 – Capacitance measuring system by the low frequency a.c. method |
| 41 | B.4 Measuring conditions |
| 42 | Annex C (informative)Thermal equilibrium time of capacitors C.1 General C.2 Thermal equilibrium time of capacitors Figure C.1 – Thermal equilibrium times of capacitors (from 85 °C to 25 °C) |
| 43 | Figure C.2 – Thermal equilibrium times of capacitors (from −40 °C to 25 °C) Figure C.3 – Capacitor core temperature change with respect to time |
| 44 | Annex D (informative)Charging/discharging efficiency and measurement current D.1 General D.2 Charging efficiency, discharging efficiency, and current |
| 46 | Annex E (informative)Procedures for setting the measurement current of capacitorwith uncertain nominal internal resistance E.1 General E.2 Current setting procedures for measurement of capacitor E.3 Example of setting current for determining capacitor characteristics Table E.1 – Example of setting current for measurement of capacitor |
| 47 | Annex F (informative)Policy on uncertainty of measurement and inset limits F.1 Objective F.2 Terms and definitions F.3 Calculation of measurement uncertainty |
| 48 | F.4 Policy F.5 Calculation of inset and outset limits F.6 Examples |
| 50 | Annex G (informative)Reference to IEC 62391-1:2006 |
| 51 | Annex Q (normative)Quality assessment procedures Q.1 General |
| 52 | Q.2 Primary stage of manufacture Q.3 Subcontracting Q.4 Structurally similar components Q.5 Qualification approval procedures |
| 53 | Q.6 Capability approval procedures |
| 54 | Figure Q.1 – General scheme for capability approval |
| 58 | Q.7 Rework and repair |
| 59 | Q.8 Release for delivery Q.9 Certified test records of released lots Q.10 Delayed delivery Q.11 Alternative test methods Q.12 Manufacture outside the geographical limits of IECQ CBs Q.13 Unchecked parameters |
| 60 | Q.14 Technology approval procedures |
| 62 | Bibliography |
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