BS EN IEC 61189-5-503:2017:2018 Edition
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Test methods for electrical materials, printed board and other interconnection structures and assemblies – General test method for materials and assemblies. Conductive anodic filaments (CAF) testing of circuit boards
Published By | Publication Date | Number of Pages |
BSI | 2018 | 30 |
This part of IEC 61189 specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).
PDF Catalog
PDF Pages | PDF Title |
---|---|
2 | undefined |
7 | CONTENTS |
9 | FOREWORD |
11 | 1 Scope 2 Normative references 3 Terms and definitions |
12 | 4 Testing condition 4.1 Standard condition |
13 | 4.2 Judgment state 5 Specimen 5.1 Outline of CAF test vehicle design 5.1.1 Evaluation design for the glass cloth direction Figures Figure 1 – Schematic of in-line test comb, with possible failure site |
14 | 5.1.2 Design between plated through hole (PTH) Figure 2 – Schematic of staggered test comb, with possible failure site Figure 3 – Manhattan distance |
15 | 5.2 CAF test board 5.2.1 Example A Figure 4 – Schematic section of via pair with bias Figure 5 – Example of inner layer via pads and layer patterns Figure 6 – Example of no inner layer via pads and layer patterns |
16 | 5.2.2 Example B Figure 7 – Insulation evaluation pattern for through-holes and via holes Tables Table 1 – Dimension of insulation evaluation pattern for through-holes |
17 | Figure 8 – Layouts of the two versions of the CAF test boards Table 2 – Test structures A1 through A4 design rules |
18 | 5.3 Number of specimens 6 Equipment/Apparatus or material 6.1 Environmental test chamber 6.2 Measuring equipment 6.3 Power supply Table 3 – Test structures B1 through B4 design rules |
19 | 6.4 Current limiting resistors 6.5 Connecting wire 6.6 Other dedicated fixtures 7 Resistance measurement method 7.1 Manual insulation resistance measurement method |
20 | 7.2 Automatic insulation resistance measurement method Figure 9 – Measurement with insulation resistance meter |
21 | 8 Test method 8.1 Test method selection 8.2 Steady-state temperature and humidity test 8.2.1 Object 8.2.2 Test condition 8.3 Temperature and humidity (12 h + 12 h) cycle test 8.3.1 Object Table 4 – Test condition |
22 | 8.3.2 Test condition 8.3.3 Number of cycles of the test 8.4 Temperature and humidity cyclic test with and without low temperature exposure 8.4.1 Object 8.4.2 Test condition 8.5 Steady-state high temperature and high humidity (unsaturated pressurized vapour) test 8.5.1 Object Table 5 – Number of cycles of the test Table 6 – Test condition |
23 | 8.5.2 Test condition 9 Procedure 9.1 Test specimen preparation 9.1.1 General 9.1.2 Sample identification 9.1.3 Prescreen for opens and shorts Table 7 – Test condition (IEC 60068-2-66) |
24 | 9.1.4 Cleaning 9.1.5 Connecting wire 9.1.6 Cleaning after attachment 9.1.7 Dry 9.2 Precondition 9.3 Test procedure 9.3.1 Setting of the specimen 9.3.2 Test voltage and measuring voltage |
25 | 9.3.3 Temperature and humidity condition at the start time of the test 9.3.4 Measurement Figure 10 – Temperature and humidity in a test |
26 | 9.3.5 Procedure in test interruption 9.3.6 End of test 9.4 Visual inspection 9.4.1 General 9.4.2 Shape of electrochemical migration |
27 | Annex A (informative)Forms of electrochemical migration A.1 Example of dendrite-shaped migration A.2 CAF (Example of migration along the glass fibre) Figure A.1 – Example which is generated on the board surface Figure A.2 – Example of CAF |
28 | Bibliography |