Shopping Cart

No products in the cart.

BS EN IEC 61189-5-503:2017:2018 Edition

$142.49

Test methods for electrical materials, printed board and other interconnection structures and assemblies – General test method for materials and assemblies. Conductive anodic filaments (CAF) testing of circuit boards

Published By Publication Date Number of Pages
BSI 2018 30
Guaranteed Safe Checkout
Category:

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

This part of IEC 61189 specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).

PDF Catalog

PDF Pages PDF Title
2 undefined
7 CONTENTS
9 FOREWORD
11 1 Scope
2 Normative references
3 Terms and definitions
12 4 Testing condition
4.1 Standard condition
13 4.2 Judgment state
5 Specimen
5.1 Outline of CAF test vehicle design
5.1.1 Evaluation design for the glass cloth direction
Figures
Figure 1 – Schematic of in-line test comb, with possible failure site
14 5.1.2 Design between plated through hole (PTH)
Figure 2 – Schematic of staggered test comb, with possible failure site
Figure 3 – Manhattan distance
15 5.2 CAF test board
5.2.1 Example A
Figure 4 – Schematic section of via pair with bias
Figure 5 – Example of inner layer via pads and layer patterns
Figure 6 – Example of no inner layer via pads and layer patterns
16 5.2.2 Example B
Figure 7 – Insulation evaluation pattern for through-holes and via holes
Tables
Table 1 – Dimension of insulation evaluation pattern for through-holes
17 Figure 8 – Layouts of the two versions of the CAF test boards
Table 2 – Test structures A1 through A4 design rules
18 5.3 Number of specimens
6 Equipment/Apparatus or material
6.1 Environmental test chamber
6.2 Measuring equipment
6.3 Power supply
Table 3 – Test structures B1 through B4 design rules
19 6.4 Current limiting resistors
6.5 Connecting wire
6.6 Other dedicated fixtures
7 Resistance measurement method
7.1 Manual insulation resistance measurement method
20 7.2 Automatic insulation resistance measurement method
Figure 9 – Measurement with insulation resistance meter
21 8 Test method
8.1 Test method selection
8.2 Steady-state temperature and humidity test
8.2.1 Object
8.2.2 Test condition
8.3 Temperature and humidity (12 h + 12 h) cycle test
8.3.1 Object
Table 4 – Test condition
22 8.3.2 Test condition
8.3.3 Number of cycles of the test
8.4 Temperature and humidity cyclic test with and without low temperature exposure
8.4.1 Object
8.4.2 Test condition
8.5 Steady-state high temperature and high humidity (unsaturated pressurized vapour) test
8.5.1 Object
Table 5 – Number of cycles of the test
Table 6 – Test condition
23 8.5.2 Test condition
9 Procedure
9.1 Test specimen preparation
9.1.1 General
9.1.2 Sample identification
9.1.3 Prescreen for opens and shorts
Table 7 – Test condition (IEC 60068-2-66)
24 9.1.4 Cleaning
9.1.5 Connecting wire
9.1.6 Cleaning after attachment
9.1.7 Dry
9.2 Precondition
9.3 Test procedure
9.3.1 Setting of the specimen
9.3.2 Test voltage and measuring voltage
25 9.3.3 Temperature and humidity condition at the start time of the test
9.3.4 Measurement
Figure 10 – Temperature and humidity in a test
26 9.3.5 Procedure in test interruption
9.3.6 End of test
9.4 Visual inspection
9.4.1 General
9.4.2 Shape of electrochemical migration
27 Annex A (informative)Forms of electrochemical migration
A.1 Example of dendrite-shaped migration
A.2 CAF (Example of migration along the glass fibre)
Figure A.1 – Example which is generated on the board surface
Figure A.2 – Example of CAF
28 Bibliography
BS EN IEC 61189-5-503:2017
$142.49