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BS EN IEC 61280-4-2:2024

BS EN IEC 61280-4-2:2024

$215.11

Fibre-optic communication subsystem test procedures – Installed cabling plant. Single-mode attenuation and optical return loss measurements

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BSI 2024 98
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IEC 61280-4-2:2024 is available as IEC 61280-4-2:2024 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 62180-4-2:2024 is applicable to the measurements of attenuation and optical return loss of an installed optical fibre cabling plant using single-mode fibre. This cabling plant can include single-mode optical fibres, connectors, adapters, splices, and other passive devices. The cabling can be installed in a variety of environments including residential, commercial, industrial and data centre premises, as well as outside plant environments. This document is applicable to all single-mode fibre types including those designated by IEC 60793-2-50 as Class B fibres. The principles of this document can be applied to cabling plants containing branching devices (splitters) and at specific wavelength ranges in situations where passive wavelength selective components are deployed, such as WDM, CWDM and DWDM devices. This document is not intended to apply to cabling plants that include active devices such as fibre amplifiers or dynamic channel equalizers. This third edition cancels and replaces the second edition published in 2014. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) addition of the equipment cord method; b) addition of test limit adjustment related to test cord grades; c) refinements on measurement uncertainties.

PDF Catalog

PDF Pages PDF Title
2 undefined
5 Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
6 English
CONTENTS
12 FOREWORD
14 INTRODUCTION
15 1 Scope
2 Normative references
16 3 Terms, definitions, graphical symbols and abbreviated terms
3.1 Terms and definitions
18 3.2 Graphical symbols
19 Figures
Figure 1 – Connector symbols
20 3.3 Abbreviated terms
4 Measurement methods
4.1 General
4.1.1 Document structure
Figure 2 – Symbol for cabling under test
21 4.1.2 Attenuation
4.1.3 Optical return loss
22 4.2 Cabling configurations and applicable test methods
4.2.1 Cabling configurations and applicable test methods for attenuation measurements
Tables
Table 1 – Cabling configurations
23 Figure 3 – Configuration A – Start and end of measured attenuations in RTM
24 Figure 4 – Configuration B – Start and end of measured attenuations in RTM
Figure 5 – Configuration C – Start and end of measured attenuations in RTM
25 Figure 6 – Configuration D – Start and end of measured attenuations in RTM
Table 2 – Test methods and configurations
26 4.2.2 Cabling configurations and applicable test methods for optical return loss measurements
5 Overview of uncertainties for attenuation measurements
5.1 General
5.2 Sources of significant uncertainties
5.3 Consideration of the power meter
27 5.4 Consideration of test cord and connector grade
5.4.1 General
5.4.2 Mode field diameter variation
5.5 Reflections from other interfaces
Table 3 – Test limit adjustment and uncertainty related to test cord connector grade
28 5.6 Optical source
5.7 Output power reference
5.8 Bi-directional measurements
5.9 Typical uncertainties for attenuation methods A, B, C, and D
29 Table 4 – Uncertainty for given fibre length and attenuation at 1 310 nm, 1 550 nm and 1 625 nm
30 5.10 Typical uncertainty values for single-mode attenuation testing for method E
6 Apparatus
6.1 General
6.2 Light source
6.2.1 Stability
Table 5 – Uncertainty for a given fibre length at 1 310 nm and 1 550 nm using an OTDR
31 6.2.2 Spectral characteristics
Table 6 – Spectral requirements
32 6.3 Launch cord
6.4 Receive or tail cords
6.5 Substitution cord
6.6 Power meter – LSPM methods only
33 6.7 OTDR apparatus
6.8 Return loss test set
Figure 7 – Typical OTDR schematic diagram
34 6.9 Connector end-face cleaning and inspection equipment
6.10 Adapters
Figure 8 – Illustration of return loss test set
35 7 Procedures
7.1 General
7.2 Common procedures
7.2.1 Care of the test cords
7.2.2 Make reference measurements (LSPM and OCWR methods only)
7.2.3 Inspect and clean the ends of the fibres in the cabling
36 7.2.4 Make the measurements
7.2.5 Make the calculations
7.3 Calibration
7.4 Safety
8 Calculations
9 Documentation
9.1 Information for each test
37 9.2 Information to be made available
38 Annexes
Annex A (normative) One-cord reference method
A.1 Applicability of test method
A.2 Apparatus
A.3 Procedure
39 A.4 Calculation
Figure A.1 – One-cord reference measurement
Figure A.2 – One-cord test measurement
40 A.5 Components of reported attenuation
41 Annex B (normative) Three-cord reference method
B.1 Applicability of test method
B.2 Apparatus
B.3 Procedure
Figure B.1 – Three-cord reference measurement
42 B.4 Calculations
B.5 Components of reported attenuation
Figure B.2 – Three-cord test measurement
43 Annex C (normative) Two-cord reference method
C.1 Applicability of test method
C.2 Apparatus
C.3 Procedure
44 Figure C.1 – Two-cord reference measurement
Figure C.2 – Two-cord test measurement
Figure C.3 – Two-cord test measurement for plug-to-socket style connectors
45 C.4 Calculations
C.5 Components of reported attenuation
46 Annex D (normative) Equipment cord method
D.1 Applicability of the test method
D.2 Apparatus
D.3 Procedure
47 D.4 Calculation
Figure D.1 – Reference measurement
Figure D.2 – Test measurement
48 D.5 Components of reported attenuation
49 Annex E (normative) Optical time domain reflectometer
E.1 Applicability of test method
E.2 Apparatus
E.2.1 General
E.2.2 OTDR
E.2.3 Test cords
50 E.3 Procedure (test method)
Table E.1 – Typical launch and tail cord lengths
51 E.4 Calculation of attenuation
E.4.1 General
E.4.2 Connection location
Figure E.1 – Test measurement for OTDR method
52 E.4.3 Definition of the power levels F1 and F2
Figure E.2 – Location of the cabling under test ports
53 E.4.4 Alternative calculation
Figure E.3 – Graphic construction of F1 and F2
55 E.5 Calculation of optical return loss
Figure E.4 – Graphic construction of F1, F11, F21 and F2
57 E.6 Calculation of reflectance for discrete components
Figure E.5 – Graphic representation of OTDR ORL measurement
58 Figure E.6 – Graphic representation of reflectance measurement
59 E.7 OTDR uncertainties
60 Annex F (normative) Continuous wave optical return loss measurement – Method A
F.1 Applicability of test method
F.2 Apparatus
F.2.1 General
F.2.2 Light source
F.2.3 Branching device or coupler
Figure F.1 – Return loss test set illustration
61 F.2.4 Power meters
F.2.5 Connector interface
F.2.6 Low reflection termination
F.3 Procedure
F.3.1 Test set characterization
62 Figure F.2 – Measurement of the system internal attenuation Pref2
Figure F.3 – Measurement of the system internal attenuation Pref1
Figure F.4 – Measurement of the system reflected power Prs
63 F.3.2 Measurement procedure
F.3.3 Calculations
Figure F.5 – Measurement of the input power Pin
Figure F.6 – Measurement of the reflected power Pr
65 Annex G (normative) Continuous wave optical return loss measurement – Method B
G.1 Applicability of test method
G.2 Apparatus
G.2.1 General requirements
G.2.2 Known reflectance termination
Figure G.1 – Return loss test set illustration
66 G.3 Procedure
G.3.1 Set-up characterization
G.3.2 Measurement procedure
Figure G.2 – Measurement of Prs with reflections suppressed
Figure G.3 – Measurement of Pref with reference reflector
67 G.3.3 Calculation
Figure G.4 – Measurement of the system reflected power Prs
Figure G.5 – Measurement of the reflected power Pr
68 Annex H (normative) On the use of reference-grade test cords
H.1 General
H.2 Practical configurations and assumptions
H.2.1 Component specifications
69 H.2.2 Conventions
H.2.3 Reference planes
Table H.1 – Expected attenuation for examples
70 H.3 Impact of using reference-grade test cords for recommended LSPM methods
H.4 Examples for LSPM measurements
H.4.1 Example 1 (configuration A, one-cord method, Annex A)
Table H.2 – Test limit adjustment when using reference-grade test cords
71 H.4.2 Example 2 (configuration B, three-cord method, Annex B)
H.4.3 Example 3 (configuration C, two-cord method, Annex C)
72 H.4.4 Example 4 – Long haul system (one-cord reference method)
H.5 Impact of using reference-grade test cords for different configurations using the OTDR test method
H.5.1 Cabling configurations A, B and C
Figure H.1 – Cabling configurations A, B and C tested with the OTDR method
73 H.5.2 Cabling configuration D
Table H.3 – Test limit adjustment when using reference-grade test cords –OTDR test method
74 Figure H.2 – Cabling configuration D tested with the OTDR method
75 Annex I (informative) OTDR configuration information
I.1 Introductory remarks
76 I.2 Fundamental parameters that define the operational capability of an OTDR
I.2.1 Dynamic range
I.2.2 Dynamic margin
I.2.3 Pulse width
I.2.4 Averaging time
I.2.5 Dead zone
77 I.3 Other parameters
I.3.1 Index of refraction
I.3.2 Measurement range
I.3.3 Distance sampling
I.4 Other measurement configurations
I.4.1 General
I.4.2 Macrobend attenuation measurement
Table I.1 – Example of effective group index of refraction values
78 I.4.3 Splice attenuation measurement
I.4.4 Measurement with high reflection connectors or short length cabling
Figure I.1 – Splice and macrobend attenuation measurement
79 Figure I.2 – Attenuation measurement with high reflection connectors
80 I.4.5 Ghost
Figure I.3 – Attenuation measurement of a short length cabling
81 I.5 More on the measurement method
Figure I.4 – OTDR trace with ghost
82 I.6 Bi-directional measurement
Figure I.5 – Cursor positioning
83 I.7 OTDR bi-directional trace analysis
Figure I.6 – Bi-directional OTDR trace display
84 I.8 Non-recommended practices
I.8.1 Measurement without tail cord
I.8.2 Two cursors measurement
Figure I.7 – Bi-directional OTDR trace attenuation analysis
85 Annex J (informative) Test cord attenuation verification
J.1 Introductory remarks
J.2 Apparatus
J.3 Procedure
J.3.1 General
86 J.3.2 Test cord verification for the one-cord and two-cord reference test methods when using non-pinned or unpinned and non-plug or socket style connectors
87 J.3.3 Test cord verification for the one-cord and two-cord reference test methods using pinned-to-unpinned or plug-to-socket style connectors
Figure J.1 – Obtaining reference power level P0
Figure J.2 – Obtaining power level P1
88 Figure J.3 – Obtaining reference power level P0
Figure J.4 – Obtaining power level P1
89 J.3.4 Test cord verification for the three-cord reference test method using non-pinned or unpinned and non-plug or socket style connectors
Figure J.5 – Obtaining reference power level P0
Figure J.6 – Obtaining power level P1
90 Figure J.7 – Obtaining reference power level P0
91 J.3.5 Test cord verification for the three-cord reference test method using pinned-to-unpinned or plug-to-socket style connectors
Figure J.8 – Obtaining power level P1
Figure J.9 – Obtaining power level P6
92 Figure J.10 – Obtaining reference power level P0
Figure J.11 – Obtaining power level P1
93 Annex K (informative) Spectral attenuation measurement
K.1 Applicability of test method
K.2 Apparatus
K.2.1 Broadband light source
K.2.2 Optical spectrum analyser
94 K.3 Procedure
K.3.1 Reference scan
K.3.2 Measurement scan
K.4 Calculations
Figure K.1 – Result of spectral attenuation measurement
95 Bibliography

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BS EN IEC 61280-4-2:2024
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