BS IEC 62860:2013:2014 Edition
$142.49
Test methods for the characterization of organic transistors and materials
| Published By | Publication Date | Number of Pages |
| BSI | 2014 | 28 |
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 4 | CONTENTS |
| 11 | 1. Overview 1.1 Scope 1.2 Purpose |
| 12 | 1.3 Electrical characterization overview |
| 13 | 2. Definitions, acronyms, and abbreviations 2.1 Definitions |
| 16 | 2.2 Acronyms and abbreviations 3. Standard OFET characterization procedures 3.1 Device structures |
| 17 | 3.2 Guidelines for the OFET characterization process |
| 18 | 3.3 Electrical standards |
| 21 | 3.4 Reporting data |
| 23 | 3.5 Environmental control and standards |
| 24 | Annex A (informative) Bibliography |
| 25 | Annex B (informative) IEEE List of Participants |
