BS QC 720100:1991

$102.76

Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices

Published By	Publication Date	Number of Pages
BSI	1991	18

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Description

Test and measurement procedures, inspection requirements together with associated screening and sampling requirements, and quality assessment procedures to be used in preparing detail specifications for optoelectronic devices in accordance with the appropriate blank detail specification.

Additional information

Status	Withdrawn
Pages	18
Publication Date	1991-12-20
Withdrawn Date	2012-04-25
ISBN	0 580 20369 7
Standard Number	BS QC 720100:1991
Title	Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices
Identical National Standard Of	QC 720100:1991, IEC 60747-12:1991
Descriptors	Phototransistors, Dimensions, Qualification approval, Conformity, Samples, Endurance testing, Assessed quality, Light-emitting diodes, Semiconductor diodes, Optoelectronic devices, Photoemission, Quality assurance systems, Sampling tables, Diodes, Semiconductor devices, Mechanical testing
Publisher	BSI
Committee	EPL/47
ICS Codes	31.260 - Optoelectronics. Laser equipment

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BS QC 720100:1991

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