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IEC TS 62876-2-1:2018

IEC TS 62876-2-1:2018

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Nanotechnology – Reliability assessment – Part 2-1: Nano-enabled photovoltaic devices – Stability test

Published By Publication Date Number of Pages
IEC 2018-08-29 34
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IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.

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IEC TS 62876-2-1:2018
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