IEEE 1620-2008
$75.29
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
| Published By | Publication Date | Number of Pages |
| IEEE | 2008 | 24 |
Revision Standard – Inactive-Reserved. This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Std 1620-2008 Front Cover |
| 6 | Introduction Notice to users Laws and regulations Copyrights Updating of IEEE documents |
| 7 | Errata Interpretations Patents |
| 8 | Participants |
| 10 | Contents |
| 11 | Important notice 1. Overview 1.1 Scope 1.2 Purpose |
| 12 | 1.3 Electrical characterization overview |
| 13 | 2. Definitions, acronyms, and abbreviations 2.1 Definitions |
| 16 | 2.2 Acronyms and abbreviations 3. Standard OFET characterization procedures 3.1 Device structures |
| 17 | 3.2 Guidelines for the OFET characterization process |
| 18 | 3.3 Electrical standards |
| 21 | 3.4 Reporting data |
| 23 | 3.5 Environmental control and standards |
| 24 | Annex A (informative) Bibliography |
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