{"id":233834,"date":"2024-10-19T15:14:57","date_gmt":"2024-10-19T15:14:57","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-62969-42018\/"},"modified":"2024-10-25T09:45:51","modified_gmt":"2024-10-25T09:45:51","slug":"bs-en-iec-62969-42018","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-62969-42018\/","title":{"rendered":"BS EN IEC 62969-4:2018"},"content":{"rendered":"

IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
5<\/td>\nEnglish
CONTENTS <\/td>\n<\/tr>\n
6<\/td>\nFOREWORD <\/td>\n<\/tr>\n
8<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
9<\/td>\n1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions <\/td>\n<\/tr>\n
10<\/td>\n3.2 Abbreviated terms
4 Evaluation and tests
4.1 Evaluation test setup
4.2 Block diagram
Figures
Figure 1 \u2013 The semiconductor-based sensor data interface test with fault injection <\/td>\n<\/tr>\n
11<\/td>\n4.3 Input and output connector setup
4.4 Test conditions and configurations
Figure 2 \u2013 Block diagram of the data interface example of duplex channel <\/td>\n<\/tr>\n
12<\/td>\n4.5 Disturbances test conditions <\/td>\n<\/tr>\n
13<\/td>\n5 Disturbance test item
5.1 Data interface load
5.1.1 Variable impedance
Figure 3 \u2013 Fault injection test configuration example of the sensor data interface <\/td>\n<\/tr>\n
14<\/td>\n5.1.2 Direct crosstalk
5.1.3 Diagonal crosstalk
5.2 Data interface line status
5.2.1 Short circuit <\/td>\n<\/tr>\n
15<\/td>\n5.2.2 Data interface break
5.3 Fault injection
5.3.1 Disturbing signals <\/td>\n<\/tr>\n
16<\/td>\nFigure 4 \u2013 Disturbing signal put onto the data interface <\/td>\n<\/tr>\n
17<\/td>\n5.3.2 Overwrite signals
Figure 5 \u2013 The node receives invalid signals <\/td>\n<\/tr>\n
18<\/td>\n5.3.3 Signal generator
5.3.4 Trigger <\/td>\n<\/tr>\n
20<\/td>\nAnnex A (informative)Description of disturbance detail items <\/td>\n<\/tr>\n
22<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Semiconductor devices. Semiconductor interface for automotive vehicles – Evaluation method of data interface for automotive vehicle sensors<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2018<\/td>\n24<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":233836,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[577,2641],"product_tag":[],"class_list":{"0":"post-233834","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-080-99","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/233834","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/233836"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=233834"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=233834"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=233834"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}