IEC 61340-2-3:2016 is available as \/2 which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition. IEC 61340-2-3:2016 describes test methods for the determination of the electrical resistance and resistivity of solid materials used to avoid electrostatic charge accumulation, in which the measured resistance is in the range 10K Ohm to 1T Ohm. It takes account of existing IEC\/ISO standards and other published information, and gives recommendations and guidelines on the appropriate method. This edition includes the following significant technical changes with respect to the previous edition: a) a distinction has been introduced between instrumentation used for laboratory evaluations, instrumentation used for acceptance testing and instrumentation used for compliance verification (periodic testing); b) an alternative electrode assembly is described, which can be used on non-planar products or when the dimensions of the product under test are too small to allow the larger electrode assembly to be used; c) the formulae for calculating surface and volume resistivity have been modified to correspond with common industry practice in the main areas of application for the IEC 61340 series.<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 49<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 51<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
| 53<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 54<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 56<\/td>\n | 4 Conditioning and test environment 5 Selection of test method <\/td>\n<\/tr>\n | ||||||
| 57<\/td>\n | 6 Resistance measurements for solid conductive materials 7 Resistance measurements for solid insulating materials 8 Resistance measurements for planar electrostatic dissipative materials (used to avoid electrostatic charge accumulation) 8.1 Instrumentation 8.1.1 General 8.1.2 Instrumentation for laboratory evaluation 8.1.3 Instrumentation for acceptance testing <\/td>\n<\/tr>\n | ||||||
| 58<\/td>\n | 8.1.4 Instrumentation for compliance verification (periodic testing) 8.2 Electrode assemblies 8.2.1 General 8.2.2 Assembly for the measurement of surface resistance <\/td>\n<\/tr>\n | ||||||
| 59<\/td>\n | 8.2.3 Assembly for the measurement of volume resistance 8.2.4 Assembly for the measurement of resistance to ground\/groundable pointand point-to-point resistance Figures Figure 1 \u2013 Example of an assembly for the measurement of surface and volume resistance <\/td>\n<\/tr>\n | ||||||
| 60<\/td>\n | 8.2.5 Test support 8.3 Sample preparation and handling Figure 2 \u2013 Example of an assembly for the measurement of resistance to ground\/groundable point and point-to-point resistance <\/td>\n<\/tr>\n | ||||||
| 61<\/td>\n | 8.4 Test procedures 8.4.1 Surface resistance measurements 8.4.2 Volume resistance measurements Figure 3 \u2013 Basic connections of the electrodes for surface resistance measurements <\/td>\n<\/tr>\n | ||||||
| 62<\/td>\n | 8.4.3 Resistance to groundable point measurements Figure 4 \u2013 Basic connections of the electrodes for volume resistance measurements <\/td>\n<\/tr>\n | ||||||
| 63<\/td>\n | 8.4.4 Point-to-point resistance measurements Figure 5 \u2013 Principle of resistance to groundable point measurements <\/td>\n<\/tr>\n | ||||||
| 64<\/td>\n | 9 Conversion to resistivity values 9.1 Surface resistivity \u03c1s 9.2 Volume resistivity \u03c1v Figure 6 \u2013 Principle of point-to-point measurements <\/td>\n<\/tr>\n | ||||||
| 65<\/td>\n | 10 Resistance measurements for non-planar materials and products with small structures 10.1 General considerations 10.2 Equipment 10.2.1 Probe Figure 7 \u2013 Configuration for the conversion to surface or volume resistivity <\/td>\n<\/tr>\n | ||||||
| 66<\/td>\n | Tables Table 1 \u2013 Material for two-point probe <\/td>\n<\/tr>\n | ||||||
| 67<\/td>\n | 10.2.2 Sample support surface 10.2.3 Resistance measurement apparatus Figure 8 \u2013 Two-point probe configuration <\/td>\n<\/tr>\n | ||||||
| 68<\/td>\n | 10.2.4 Test leads Figure 9 \u2013 Probe to instrumentation connection <\/td>\n<\/tr>\n | ||||||
| 69<\/td>\n | 10.3 Test procedure 11 Repeatability and reproducibility Figure 10 \u2013 Spring compression for measurement <\/td>\n<\/tr>\n | ||||||
| 70<\/td>\n | 12 Test report <\/td>\n<\/tr>\n | ||||||
| 72<\/td>\n | Annex A (normative) System verification A.1 System verification for surface resistance measurements A.1.1 Fixture and procedure for lower resistance range Figure A.1 \u2013 Lower resistance range verification fixture for surface resistance measurements <\/td>\n<\/tr>\n | ||||||
| 73<\/td>\n | A.1.2 Fixture and procedure for upper resistance range and determination of electrification period Figure A.2 \u2013 Upper resistance range verification fixture for surface resistance measurements <\/td>\n<\/tr>\n | ||||||
| 74<\/td>\n | A.2 System verification for volume resistance measurements A.2.1 Fixture and procedure for lower resistance range A.2.2 Fixture and procedure for upper resistance range and determination of electrification period A.3 System verification for resistance measurements for non-planar materials and products with small structures A.3.1 Verification fixtures <\/td>\n<\/tr>\n | ||||||
| 75<\/td>\n | A.3.2 Verification procedure Figure A.3 \u2013 Resistance verification fixture <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Tracked Changes. Electrostatics – Methods of test for determining the resistance and resistivity of solid materials used to avoid electrostatic charge accumulation<\/b><\/p>\n |