IEC 61000-4-6:2013 relates to the conducted immunity requirements of electrical and electronic equipment to electromagnetic disturbances coming from intended radio-frequency (RF) transmitters in the frequency range 150 kHz up to 80 MHz. Equipment not having at least one conducting wire and\/or cable (such as mains supply, signal line or earth connection) which can couple the equipment to the disturbing RF fields is excluded from the scope of this publication. The object of this standard is to establish a common reference for evaluating the functional immunity of electrical and electronic equipment when subjected to conducted disturbances induced by RF fields. The test method documented in IEC 61000-4-6:2013 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. This fourth edition cancels and replaces the third edition published in 2008 and constitutes a technical revision. It includes the following significant technical changes with respect to the previous edition: – use of the CDNs; – calibration of the clamps; – reorganization of Clause 7 on test setup and injection methods; – Annex A which is now dedicated to EM and decoupling clamps; – Annex G which now addresses the measurement uncertainty of the voltage test level; – and informative Annexes H, I and J which are new. The contents of the corrigendum of June 2015 have been included in this copy.<\/p>\n
| PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
|---|---|---|---|---|---|---|---|
| 6<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
| 9<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
| 10<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
| 12<\/td>\n | 4 General <\/td>\n<\/tr>\n | ||||||
| 14<\/td>\n | 5 Test levels Figures Figure 1 \u2013 Immunity test to RF conducted disturbances <\/td>\n<\/tr>\n | ||||||
| 15<\/td>\n | 6 Test equipment and level adjustment procedures 6.1 Test generator Figure 2 \u2013 Open circuit waveforms at the EUT portof a coupling device for test level 1 Tables Table 1 \u2013 Test levels <\/td>\n<\/tr>\n | ||||||
| 16<\/td>\n | Table 2 \u2013 Characteristics of the test generator <\/td>\n<\/tr>\n | ||||||
| 17<\/td>\n | 6.2 Coupling and decoupling devices 6.2.1 General Figure 3 \u2013 Test generator setup Table 3 \u2013 Main parameter of the combination of the coupling and decoupling device <\/td>\n<\/tr>\n | ||||||
| 20<\/td>\n | 6.2.2 Coupling\/decoupling networks (CDNs) Figure 4 \u2013 Principle of coupling and decoupling Table 4 \u2013 Usage of CDNs <\/td>\n<\/tr>\n | ||||||
| 22<\/td>\n | 6.2.3 Clamp injection devices Figure 5 \u2013 Principle of coupling and decouplingaccording to the clamp injection method <\/td>\n<\/tr>\n | ||||||
| 23<\/td>\n | Figure 6 \u2013 Example of circuit for level setting setup in a 150 \u03a9 test jig <\/td>\n<\/tr>\n | ||||||
| 24<\/td>\n | 6.2.4 Direct injection devices 6.2.5 Decoupling networks Figure 7 \u2013 Example circuit for evaluating the performance of the current clamp <\/td>\n<\/tr>\n | ||||||
| 25<\/td>\n | 6.3 Verification of the common mode impedance at the EUT port of coupling and decoupling devices 6.3.1 General 6.3.2 Insertion loss of the 150\u00a0( to 50\u00a0( adapters <\/td>\n<\/tr>\n | ||||||
| 27<\/td>\n | 6.4 Setting of the test generator 6.4.1 General Figure 8 \u2013 Details of setups and components to verify the essential characteristics of coupling and decoupling devices and the 150 \u03a9 to 50 \u03a9 adapters <\/td>\n<\/tr>\n | ||||||
| 28<\/td>\n | 6.4.2 Setting of the output level at the EUT port of the coupling device <\/td>\n<\/tr>\n | ||||||
| 29<\/td>\n | Figure 9 \u2013 Setup for level setting <\/td>\n<\/tr>\n | ||||||
| 30<\/td>\n | 7 Test setup and injection methods 7.1 Test setup 7.2 EUT comprising a single unit <\/td>\n<\/tr>\n | ||||||
| 31<\/td>\n | 7.3 EUT comprising several units Figure 10 \u2013 Example of test setup with a single unit EUT (top view) <\/td>\n<\/tr>\n | ||||||
| 32<\/td>\n | 7.4 Rules for selecting injection methods and test points 7.4.1 General 7.4.2 Injection method Figure 11 \u2013 Example of a test setup with a multi-unit EUT (top view) <\/td>\n<\/tr>\n | ||||||
| 33<\/td>\n | 7.4.3 Ports to be tested Figure 12 \u2013 Rules for selecting the injection method <\/td>\n<\/tr>\n | ||||||
| 34<\/td>\n | 7.5 CDN injection application <\/td>\n<\/tr>\n | ||||||
| 35<\/td>\n | 7.6 Clamp injection application when the common mode impedance requirements can be met Figure 13 \u2013 Immunity test to 2-port EUT (when only one CDN can be used) <\/td>\n<\/tr>\n | ||||||
| 36<\/td>\n | Figure 14 \u2013 General principle of a test setup using clamp injection devices <\/td>\n<\/tr>\n | ||||||
| 37<\/td>\n | 7.7 Clamp injection application when the common mode impedance requirements cannot be met 7.8 Direct injection application Figure 15 \u2013 Example of the test unit locations on the ground plane when using injection clamps (top view) <\/td>\n<\/tr>\n | ||||||
| 38<\/td>\n | 8 Test procedure <\/td>\n<\/tr>\n | ||||||
| 39<\/td>\n | 9 Evaluation of the test results 10 Test report <\/td>\n<\/tr>\n | ||||||
| 41<\/td>\n | Annex A (normative) EM and decoupling clamps <\/td>\n<\/tr>\n | ||||||
| 42<\/td>\n | Figure A.1 \u2013 Example: Construction details of the EM clamp <\/td>\n<\/tr>\n | ||||||
| 43<\/td>\n | Figure A.2 \u2013 Example: Concept of the EM clamp <\/td>\n<\/tr>\n | ||||||
| 44<\/td>\n | Figure A.3 \u2013 Dimension of a reference plane Figure A.4 \u2013 Test jig Figure A.5 \u2013 Test jig with inserted clamp <\/td>\n<\/tr>\n | ||||||
| 45<\/td>\n | Figure A.6 \u2013 Impedance \/ decoupling factor measurement setup <\/td>\n<\/tr>\n | ||||||
| 46<\/td>\n | Figure A.7 \u2013 Typical examples for clamp impedance, 3 typical clamps <\/td>\n<\/tr>\n | ||||||
| 47<\/td>\n | Figure A.8 \u2013 Typical examples for decoupling factors, 3 typical clamps Figure A.9 \u2013 Normalization setup for coupling factor measurement <\/td>\n<\/tr>\n | ||||||
| 48<\/td>\n | Figure A.10 \u2013 S21 coupling factor measurement setup Figure A.11 \u2013 Typical examples for coupling factor, 3 typical clamps <\/td>\n<\/tr>\n | ||||||
| 49<\/td>\n | Figure A.12 \u2013 Decoupling clamp characterization measurement setup Figure A.13 \u2013 Typical examples for the decoupling clamp impedance <\/td>\n<\/tr>\n | ||||||
| 50<\/td>\n | Figure A.14 \u2013 Typical examples for decoupling factors <\/td>\n<\/tr>\n | ||||||
| 51<\/td>\n | Annex B (informative) Selection criteria for the frequency range of application Table B.1 \u2013 Main parameter of the combination of the coupling and decoupling device when the frequency range of test is extended above 80\u00a0MHz <\/td>\n<\/tr>\n | ||||||
| 52<\/td>\n | Figure B.1 \u2013 Start frequency as function of cable length and equipment size <\/td>\n<\/tr>\n | ||||||
| 53<\/td>\n | Annex C (informative) Guide for selecting test levels <\/td>\n<\/tr>\n | ||||||
| 54<\/td>\n | Annex D (informative) Information on coupling and decoupling networks <\/td>\n<\/tr>\n | ||||||
| 55<\/td>\n | Figure D.1 \u2013 Example of a simplified diagram for the circuit of CDN-S1 used with screened cables (see 6.2.2.5) Figure D.2 \u2013 Example of simplified diagram for the circuit of CDN-M1\/-M2\/-M3 used with unscreened supply (mains) lines (see 6.2.2.2) <\/td>\n<\/tr>\n | ||||||
| 56<\/td>\n | Figure D.3 \u2013 Example of a simplified diagram for the circuit of CDN-AF2 used with unscreened unbalanced lines (see 6.2.2.4) Figure D.4 \u2013 Example of a simplified diagram for the circuit of a CDN-T2, used with an unscreened balanced pair (see 6.2.2.3) <\/td>\n<\/tr>\n | ||||||
| 57<\/td>\n | Figure D.5 \u2013 Example of a simplified diagram of the circuit of a CDN-T4 used with unscreened balanced pairs (see 6.2.2.3) Figure D.6 \u2013 Example of a simplified diagram of the circuit of a CDN AF8 used with unscreened unbalanced lines (see 6.2.2.4) <\/td>\n<\/tr>\n | ||||||
| 58<\/td>\n | Figure D.7 \u2013 Example of a simplified diagram of the circuit of a CDN-T8 used with unscreened balanced pairs (see 6.2.2.3) <\/td>\n<\/tr>\n | ||||||
| 59<\/td>\n | Annex E (informative) Information for the test generator specification Table E.1 \u2013 Required power amplifier output power to obtain a test level of 10\u00a0V <\/td>\n<\/tr>\n | ||||||
| 60<\/td>\n | Annex F (informative) Test setup for large EUTs <\/td>\n<\/tr>\n | ||||||
| 61<\/td>\n | Figure F.1 \u2013 Example of large EUT test setupwith elevated horizontal reference ground plane <\/td>\n<\/tr>\n | ||||||
| 62<\/td>\n | Figure F.2 \u2013 Example of large EUT test setupwith vertical reference ground plane <\/td>\n<\/tr>\n | ||||||
| 63<\/td>\n | Annex G (informative) Measurement uncertainty of the voltage test level <\/td>\n<\/tr>\n | ||||||
| 64<\/td>\n | Figure G.1 \u2013 Example of influences upon voltage test level using CDN Figure G.2 \u2013 Example of influences upon voltage test level using EM clamp <\/td>\n<\/tr>\n | ||||||
| 65<\/td>\n | Figure G.3 \u2013 Example of influences upon voltage test level using current clamp Figure G.4 \u2013 Example of influences upon voltage test level using direct injection <\/td>\n<\/tr>\n | ||||||
| 66<\/td>\n | Figure G.5 \u2013 Circuit for level setting setup <\/td>\n<\/tr>\n | ||||||
| 67<\/td>\n | Table G.1 \u2013 CDN level setting process Table G.2 \u2013 CDN test process <\/td>\n<\/tr>\n | ||||||
| 69<\/td>\n | Table G.3 \u2013 EM clamp level setting process Table G.4 \u2013 EM clamp test process <\/td>\n<\/tr>\n | ||||||
| 70<\/td>\n | Table G.5 \u2013 Current clamp level setting process <\/td>\n<\/tr>\n | ||||||
| 71<\/td>\n | Table G.6 \u2013 Current clamp test process <\/td>\n<\/tr>\n | ||||||
| 72<\/td>\n | Table G.7 \u2013 Direct injection level setting process Table G.8 \u2013 Direct injection test process <\/td>\n<\/tr>\n | ||||||
| 74<\/td>\n | Annex H (informative) Measurement of AE impedance Table H.1 \u2013 Impedance requirements for the AE <\/td>\n<\/tr>\n | ||||||
| 75<\/td>\n | Figure H.1 \u2013 Impedance measurement using a voltmeter Table H.2 \u2013 Derived voltage division ratios for AE impedance measurements <\/td>\n<\/tr>\n | ||||||
| 76<\/td>\n | Figure H.2 \u2013 Impedance measurement using a current probe Table H.3 \u2013 Derived voltage ratios for AE impedance measurements <\/td>\n<\/tr>\n | ||||||
| 78<\/td>\n | Annex I (informative) Port to port injection <\/td>\n<\/tr>\n | ||||||
| 79<\/td>\n | Figure I.1 \u2013 Example of setup, port to port injection <\/td>\n<\/tr>\n | ||||||
| 80<\/td>\n | Annex J (informative) Amplifier compression and non-linearity <\/td>\n<\/tr>\n | ||||||
| 82<\/td>\n | Figure J.1 \u2013 Amplifier linearity measurement setup <\/td>\n<\/tr>\n | ||||||
| 83<\/td>\n | Figure J.2 \u2013 Linearity characteristic Figure J.3 \u2013 Measurement setup for modulation depth <\/td>\n<\/tr>\n | ||||||
| 84<\/td>\n | Figure J.4 \u2013 Spectrum of AM modulated signal <\/td>\n<\/tr>\n | ||||||
| 85<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Electromagnetic compatibility (EMC) – Testing and measurement techniques. Immunity to conducted disturbances, induced by radio-frequency fields<\/b><\/p>\n |