{"id":302343,"date":"2024-10-19T20:39:18","date_gmt":"2024-10-19T20:39:18","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-628602013\/"},"modified":"2024-10-25T18:10:03","modified_gmt":"2024-10-25T18:10:03","slug":"bs-iec-628602013","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-628602013\/","title":{"rendered":"BS IEC 62860:2013"},"content":{"rendered":"
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 1. Overview 1.1 Scope 1.2 Purpose <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 1.3 Electrical characterization overview <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 2. Definitions, acronyms, and abbreviations 2.1 Definitions <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 2.2 Acronyms and abbreviations 3. Standard OFET characterization procedures 3.1 Device structures <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 3.2 Guidelines for the OFET characterization process <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 3.3 Electrical standards <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 3.4 Reporting data <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 3.5 Environmental control and standards <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | Annex A (informative) Bibliography <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | Annex B (informative) IEEE List of Participants <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Test methods for the characterization of organic transistors and materials<\/b><\/p>\n |