{"id":394357,"date":"2024-10-20T04:13:40","date_gmt":"2024-10-20T04:13:40","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-62586-22017a12021\/"},"modified":"2024-10-26T07:54:08","modified_gmt":"2024-10-26T07:54:08","slug":"bs-en-62586-22017a12021","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-62586-22017a12021\/","title":{"rendered":"BS EN 62586-2:2017+A1:2021"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
44<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
46<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
47<\/td>\n | 1 Scope 2 Normative references <\/td>\n<\/tr>\n | ||||||
48<\/td>\n | 3 Terms, definitions, abbreviated terms, notations and symbols 3.1 General terms and definitions 3.2 Terms and definitions related to uncertainty <\/td>\n<\/tr>\n | ||||||
49<\/td>\n | 3.3 Notations 3.3.1 Functions 3.3.2 Symbols and abbreviated terms 3.3.3 Indices 4 Requirements 4.1 Requirements for products complying with class A <\/td>\n<\/tr>\n | ||||||
50<\/td>\n | 4.2 Requirements for products complying with class S Tables Table 1 \u2013 Summary of type tests for class A <\/td>\n<\/tr>\n | ||||||
51<\/td>\n | Table 2 \u2013 Summary of type tests for class S <\/td>\n<\/tr>\n | ||||||
52<\/td>\n | 5 Functional type tests common requirements 5.1 General philosophy for testing 5.1.1 System topology 5.1.2 Stabilization time 5.1.3 Measuring ranges <\/td>\n<\/tr>\n | ||||||
53<\/td>\n | Table 3 \u2013 Testing points for each measured parameter <\/td>\n<\/tr>\n | ||||||
54<\/td>\n | 5.1.4 Single "power-system influence quantities" <\/td>\n<\/tr>\n | ||||||
55<\/td>\n | Table 4 \u2013 List of single "power-system influence quantities" <\/td>\n<\/tr>\n | ||||||
56<\/td>\n | 5.1.5 "External influence quantities" 5.1.6 Test criteria Table 5 \u2013 Influence of temperature Table 6 \u2013 Influence of auxiliary power supply voltage <\/td>\n<\/tr>\n | ||||||
57<\/td>\n | 5.2 Testing procedure 5.2.1 Device under test 5.2.2 Testing conditions 5.2.3 Testing equipment 6 Functional testing procedure for instruments complying with class A according to IEC 61000-4-30 6.1 Power frequency 6.1.1 General Table 7 \u2013 List of generic test criteria <\/td>\n<\/tr>\n | ||||||
58<\/td>\n | 6.1.2 Measurement method 6.1.3 Measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
59<\/td>\n | 6.1.4 Measurement evaluation 6.1.5 Measurement aggregation 6.2 Magnitude of supply voltage 6.2.1 Measurement method 6.2.2 Measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
60<\/td>\n | 6.2.3 Measurement evaluation 6.2.4 Measurement aggregation <\/td>\n<\/tr>\n | ||||||
62<\/td>\n | 6.3 Flicker 6.4 Supply voltage interruptions, dips and swells 6.4.1 General <\/td>\n<\/tr>\n | ||||||
65<\/td>\n | Figures Figure 1 \u2013 Overview of test for dips according to test A4.1.1 <\/td>\n<\/tr>\n | ||||||
66<\/td>\n | Figure 2 \u2013 Detail 1 of waveform for test of dips according to test A4.1.1 Figure 3 \u2013 Detail 2 of waveform for tests of dips according to A4.1.1 <\/td>\n<\/tr>\n | ||||||
67<\/td>\n | Figure 4 \u2013 Detail 3 of waveform for tests of dips according to test A4.1.1 Figure 5 \u2013 Detail 1 of waveform for test of dips according to test A4.1.2 <\/td>\n<\/tr>\n | ||||||
68<\/td>\n | Figure 6 \u2013 Detail 2 of waveform for tests of dips according to test A4.1.2 Figure 7 \u2013 Detail 1 of waveform for test of swells according to test A4.1.2 <\/td>\n<\/tr>\n | ||||||
69<\/td>\n | Figure 8 \u2013 Detail 2 of waveform for tests of swells according to test A4.1.2 Figure 9 \u2013 Sliding reference voltage test <\/td>\n<\/tr>\n | ||||||
70<\/td>\n | 6.4.2 Check dips \/ interruptions in polyphase system Figure 10 \u2013 Sliding reference start up condition <\/td>\n<\/tr>\n | ||||||
71<\/td>\n | Figure 11 \u2013 Detail 1 of waveform for test of polyphase dips\/interruptions Figure 12 \u2013 Detail 2 of waveform for test of polyphase dips\/interruptions <\/td>\n<\/tr>\n | ||||||
72<\/td>\n | 6.4.3 Check swells in polyphase system Figure 13 \u2013 Detail 3 of waveform for test of polyphase dips\/interruptions <\/td>\n<\/tr>\n | ||||||
73<\/td>\n | 6.5 Supply voltage unbalance 6.5.1 General Figure 14 \u2013 Detail 1 of waveform for test of polyphase swells Figure 15 \u2013 Detail 2 of waveform for test of polyphase swells <\/td>\n<\/tr>\n | ||||||
74<\/td>\n | 6.5.2 Measurement method, measurement uncertainty and measuring range 6.5.3 Aggregation 6.6 Voltage harmonics 6.6.1 Measurement method <\/td>\n<\/tr>\n | ||||||
75<\/td>\n | 6.6.2 Measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
76<\/td>\n | 6.6.3 Measurement evaluation 6.6.4 Measurement aggregation <\/td>\n<\/tr>\n | ||||||
78<\/td>\n | 6.7 Voltage interharmonics 6.7.1 Measurement method <\/td>\n<\/tr>\n | ||||||
79<\/td>\n | 6.7.2 Measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
80<\/td>\n | 6.7.3 Measurement evaluation 6.7.4 Measurement aggregation <\/td>\n<\/tr>\n | ||||||
82<\/td>\n | 6.8 Mains signalling voltages on the supply voltage 6.8.1 Measurement method <\/td>\n<\/tr>\n | ||||||
84<\/td>\n | 6.8.2 Measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
85<\/td>\n | 6.8.3 Aggregation 6.9 Measurement of underdeviation and overdeviation parameters 6.9.1 Measurement method <\/td>\n<\/tr>\n | ||||||
87<\/td>\n | 6.9.2 Measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
88<\/td>\n | 6.9.3 Measurement evaluation 6.9.4 Measurement aggregation <\/td>\n<\/tr>\n | ||||||
91<\/td>\n | 6.10 Flagging <\/td>\n<\/tr>\n | ||||||
92<\/td>\n | Figure 16 \u2013 Flagging test for class A <\/td>\n<\/tr>\n | ||||||
93<\/td>\n | 6.11 Clock uncertainty testing 6.12 Variations due to external influence quantities 6.12.1 General Figure 17 \u2013 Clock uncertainty testing <\/td>\n<\/tr>\n | ||||||
94<\/td>\n | 6.12.2 Influence of temperature <\/td>\n<\/tr>\n | ||||||
96<\/td>\n | 6.12.3 Influence of power supply voltage <\/td>\n<\/tr>\n | ||||||
97<\/td>\n | 6.13 Rapid voltage changes (RVC) 6.13.1 RVC parameters and evaluation 6.13.2 General Figure 18 \u2013 Example of RVC event <\/td>\n<\/tr>\n | ||||||
99<\/td>\n | 6.13.3 "No RVC" tests Table 8 \u2013 Specification of test A13.1.1 <\/td>\n<\/tr>\n | ||||||
100<\/td>\n | Figure 19 \u2013 A13.1.1 waveform Figure 20 \u2013 A13.1.1 waveform with RVC limits and arithmetic mean <\/td>\n<\/tr>\n | ||||||
101<\/td>\n | Figure 21 \u2013 A13.1.2 waveform Table 9 \u2013 Specification of test A13.1.2 <\/td>\n<\/tr>\n | ||||||
102<\/td>\n | Figure 22 \u2013 A13.1.2 waveform with RVC limits and arithmetic means Table 10 \u2013 Specification of test A13.1.3 <\/td>\n<\/tr>\n | ||||||
103<\/td>\n | 6.13.4 "RVC threshold and setup" test Figure 23 \u2013 A13.1.3 waveform Figure 24 \u2013 A13.1.3 waveform with RVC limits and arithmetic mean <\/td>\n<\/tr>\n | ||||||
104<\/td>\n | Figure 25 \u2013 A13.2.1 waveform Table 11 \u2013 Specification of test A13.2.1 <\/td>\n<\/tr>\n | ||||||
105<\/td>\n | 6.13.5 "RVC parameters" test Figure 26 \u2013 A13.2.1 waveform with RVC limits and arithmetic mean <\/td>\n<\/tr>\n | ||||||
106<\/td>\n | Figure 27 \u2013 A13.3.1 waveform Table 12 \u2013 Specification of test A13.3.1 <\/td>\n<\/tr>\n | ||||||
107<\/td>\n | 6.13.6 "RVC polyphase" tests Figure 28 \u2013 A13.3.1 waveform with RVC limits and arithmetic mean <\/td>\n<\/tr>\n | ||||||
108<\/td>\n | Figure 29 \u2013 A13.4.1 waveform Table 13 \u2013 Specification of test A13.4.1 <\/td>\n<\/tr>\n | ||||||
109<\/td>\n | 6.13.7 "Voltage is in steady-state condition" tests Table 14 \u2013 Specification of test A13.5.1 <\/td>\n<\/tr>\n | ||||||
110<\/td>\n | Figure 30 \u2013 A13.5.1 waveform Figure 31 \u2013 A13.5.1 waveform with RVC limits and arithmetic mean <\/td>\n<\/tr>\n | ||||||
111<\/td>\n | Figure 32 \u2013 A13.5.2 waveform Table 15 \u2013 Specification of test A13.5.2 <\/td>\n<\/tr>\n | ||||||
112<\/td>\n | 6.14 Magnitude of current 6.15 Harmonic current 6.16 Interharmonic currents 6.17 Current unbalance 6.17.1 General Figure 33 \u2013 A13.5.2 waveform with RVC limits and arithmetic mean <\/td>\n<\/tr>\n | ||||||
113<\/td>\n | 6.17.2 Measurement method, measurement uncertainty and measuring range 7 Functional testing procedure for instruments complying with class S according to IEC 61000-4-30 7.1 Power frequency 7.1.1 General <\/td>\n<\/tr>\n | ||||||
114<\/td>\n | 7.1.2 Measurement method 7.1.3 Measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
115<\/td>\n | 7.1.4 Measurement evaluation 7.1.5 Measurement aggregation 7.2 Magnitude of the supply voltage 7.2.1 Measurement method 7.2.2 Measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
116<\/td>\n | 7.2.3 Measurement evaluation 7.2.4 Measurement aggregation <\/td>\n<\/tr>\n | ||||||
118<\/td>\n | 7.3 Flicker 7.4 Supply voltage interruptions, dips and swells 7.4.1 General requirements <\/td>\n<\/tr>\n | ||||||
121<\/td>\n | Figure 34 \u2013 Detail 1 of waveform for test of dips according to test S4.1.2 Figure 35 \u2013 Detail 2 of waveform for tests of dips according to test S4.1.2 <\/td>\n<\/tr>\n | ||||||
122<\/td>\n | Figure 36 \u2013 Detail 1 of waveform for test of swells according to test S4.1.2 Figure 37 \u2013 Detail 2 of waveform for tests of swells according to test S4.1.2 <\/td>\n<\/tr>\n | ||||||
123<\/td>\n | Figure 38 \u2013 Sliding reference voltage test Figure 39 \u2013 Sliding reference start-up condition <\/td>\n<\/tr>\n | ||||||
124<\/td>\n | 7.4.2 Check dips \/ interruptions in polyphase system <\/td>\n<\/tr>\n | ||||||
125<\/td>\n | Figure 40 \u2013 Detail 1 of waveform for test of polyphase dips\/interruptions Figure 41 \u2013 Detail 2 of waveform for test of polyphase dips\/interruptions <\/td>\n<\/tr>\n | ||||||
126<\/td>\n | 7.4.3 Check swells in polyphase system Figure 42 \u2013 Detail 3 of waveform for test of polyphase dips\/interruptions <\/td>\n<\/tr>\n | ||||||
127<\/td>\n | 7.5 Supply voltage unbalance 7.5.1 General Figure 43 \u2013 Detail 1 of waveform for test of polyphase swells Figure 44 \u2013 Detail 2 of waveform for test of polyphase swells <\/td>\n<\/tr>\n | ||||||
128<\/td>\n | 7.5.2 Measurement method, measurement uncertainty and measuring range 7.5.3 Aggregation 7.6 Voltage harmonics 7.6.1 General <\/td>\n<\/tr>\n | ||||||
129<\/td>\n | 7.6.2 Measurement method <\/td>\n<\/tr>\n | ||||||
130<\/td>\n | 7.6.3 Measurement method, measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
131<\/td>\n | 7.6.4 Measurement evaluation 7.6.5 Measurement aggregation <\/td>\n<\/tr>\n | ||||||
133<\/td>\n | 7.7 Voltage interharmonics 7.8 Mains signalling voltages on the supply voltage 7.8.1 General <\/td>\n<\/tr>\n | ||||||
134<\/td>\n | 7.8.2 Measurement method 7.8.3 Measurement uncertainty and measuring range 7.8.4 Aggregation 7.9 Measurement of underdeviation and overdeviation parameters 7.10 Flagging <\/td>\n<\/tr>\n | ||||||
136<\/td>\n | 7.11 Clock uncertainty testing Figure 45 \u2013 Flagging test for class S <\/td>\n<\/tr>\n | ||||||
137<\/td>\n | 7.12 Variations due to external influence quantities 7.12.1 General Figure 46 \u2013 Clock uncertainty testing <\/td>\n<\/tr>\n | ||||||
138<\/td>\n | 7.12.2 Influence of temperature <\/td>\n<\/tr>\n | ||||||
140<\/td>\n | 7.12.3 Influence of power supply voltage <\/td>\n<\/tr>\n | ||||||
141<\/td>\n | 7.13 Rapid voltage changes 7.14 Magnitude of current 7.15 Harmonic current 7.16 Interharmonic currents 7.17 Current unbalance 7.17.1 General <\/td>\n<\/tr>\n | ||||||
142<\/td>\n | 7.17.2 Measurement method, measurement uncertainty and measuring range <\/td>\n<\/tr>\n | ||||||
143<\/td>\n | 8 Calculation of measurement uncertainty and operating uncertainty <\/td>\n<\/tr>\n | ||||||
144<\/td>\n | Table 16 \u2013 Uncertainty requirements <\/td>\n<\/tr>\n | ||||||
145<\/td>\n | Annexes Annex A (normative) Intrinsic uncertainty and operating uncertainty, A.1 General A.2 Measurement uncertainty Figure A.1 \u2013 Different kinds of uncertainties <\/td>\n<\/tr>\n | ||||||
146<\/td>\n | A.3 Operating uncertainty <\/td>\n<\/tr>\n | ||||||
147<\/td>\n | Annex B (informative) Overall system uncertainty <\/td>\n<\/tr>\n | ||||||
148<\/td>\n | Annex C (normative) Calculation of measurement and operating uncertainty for voltage magnitude and power frequency C.1 Selection of test points to verify operating uncertainty and uncertainty under reference conditions C.2 Class A calculation examples C.2.1 General C.2.2 Parameter: magnitude of supply voltage, Udin = 230 V, 50\/60Hz, rated range of temperature \u221225 \u00b0C to (55 \u00b0C <\/td>\n<\/tr>\n | ||||||
149<\/td>\n | C.2.3 Parameter: power frequency 50\/60 Hz, rated range of temperature \u221225 \u00b0C to (55 \u00b0C <\/td>\n<\/tr>\n | ||||||
151<\/td>\n | Annex D (informative) Further test on dips (amplitude and phase angles changes) D.1 Phase-to-phase or phase-to-neutral testing D.2 Test method Figure D.1 \u2013 Phase-to-neutral testing on three-phase systems Figure D.2 \u2013 Phase-to-phase testing on three-phase systems <\/td>\n<\/tr>\n | ||||||
152<\/td>\n | Table D.1 \u2013 Tests pattern <\/td>\n<\/tr>\n | ||||||
153<\/td>\n | Annex E (informative) Further tests on dips (polyphase): test procedure E.1 General Figure E.1 \u2013 Example for one phase of a typical N cycle injection <\/td>\n<\/tr>\n | ||||||
154<\/td>\n | E.2 Phase voltage dips and interruptions E.3 Phase swells Figure E.2 \u2013 Dip\/interruption accuracy (amplitude and timing) test <\/td>\n<\/tr>\n | ||||||
155<\/td>\n | Figure E.3 \u2013 Swell accuracy (amplitude and timing) test <\/td>\n<\/tr>\n | ||||||
156<\/td>\n | Annex F (normative) Gapless measurements of voltage amplitude and harmonics test F.1 Purpose of the test F.2 Test set up F.3 Voltage amplitude F.3.1 Test signal F.3.2 Result evaluation <\/td>\n<\/tr>\n | ||||||
157<\/td>\n | F.4 Harmonics F.4.1 Test signal F.4.2 Result evaluation <\/td>\n<\/tr>\n | ||||||
158<\/td>\n | F.5 Inter-harmonics F.5.1 Test signal F.5.2 Result evaluation <\/td>\n<\/tr>\n | ||||||
159<\/td>\n | Annex G (informative) Gapless measurements of voltage amplitude and harmonics Figure G.1 \u2013 Simulated signal under noisy conditions <\/td>\n<\/tr>\n | ||||||
160<\/td>\n | Figure G.2 \u2013 Waveform for checking gapless RMS voltage measurement Figure G.3 \u2013 2,3 Hz frequency fluctuation <\/td>\n<\/tr>\n | ||||||
161<\/td>\n | Figure G.4 \u2013 Spectral leakage effects for a missing sample <\/td>\n<\/tr>\n | ||||||
162<\/td>\n | Figure G.5 \u2013 Illustration of QRMS for missing samples Figure G.6 \u2013 Detection of a single missing sample <\/td>\n<\/tr>\n | ||||||
163<\/td>\n | Figure G.7 \u2013 QRMS for an ideal signal, sampling error = \u2212300 \u00d7 10\u22126 Figure G.8 \u2013 QRMS for an ideal signal, sampling error = 400 \u00d7 10\u22126 <\/td>\n<\/tr>\n | ||||||
164<\/td>\n | Figure G.9 \u2013 QRMS for an ideal signal, sampling error = 200 \u00d7 10\u22126 <\/td>\n<\/tr>\n | ||||||
165<\/td>\n | Figure G.10 \u2013 QH(5) with ideal test signal and perfect samplingfrequency synchronization Figure G.11 \u2013 QH(5) with 300 \u00d7 10\u22126 sampling frequency error and 100 \u00d7 10\u22126 modulation frequency error <\/td>\n<\/tr>\n | ||||||
166<\/td>\n | Figure G.12 \u2013 QRMS with a 20\/24-cycle sliding window with an output every 10\/12 cycles Figure G.13 \u2013 Amplitude test for fluctuating component <\/td>\n<\/tr>\n | ||||||
168<\/td>\n | Annex H (informative) Testing equipment recommendations H.1 Testing range H.2 Uncertainty and stability of source and reference meter H.2.1 Uncertainty of source and reference meter Table H.1 \u2013 Testing range <\/td>\n<\/tr>\n | ||||||
169<\/td>\n | H.2.2 Stability of the source H.3 Time synchronisation H.4 Power quality functions of source and reference meter Table H.2 \u2013 Uncertainty of source and reference meter Table H.3 \u2013 Stability of source <\/td>\n<\/tr>\n | ||||||
170<\/td>\n | H.5 Traceability <\/td>\n<\/tr>\n | ||||||
171<\/td>\n | Annex I (informative) Recommendations related to a declaration of conformity (DoC) and a test report I.1 Definitions I.2 Recommendations I.3 Example of IEC 62586-1 declaration of conformity <\/td>\n<\/tr>\n | ||||||
172<\/td>\n | Table I.1 \u2013 Example of a DoC related to compliance with IEC 62586-1 <\/td>\n<\/tr>\n | ||||||
173<\/td>\n | I.4 Example of IEC 62586-2 declaration I.4.1 General <\/td>\n<\/tr>\n | ||||||
174<\/td>\n | I.4.2 Recommendation for IEC 62586-2 test report Table I.2 \u2013 Example of DoC related to compliance with IEC 62586-2 <\/td>\n<\/tr>\n | ||||||
175<\/td>\n | I.4.3 Recommendation for IEC 62586-2 test summary I.4.4 Recommendation for IEC 62586-2 test equipment information I.4.5 Recommendation for IEC 62586-2 tested functions <\/td>\n<\/tr>\n | ||||||
176<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Power quality measurement in power supply systems – Functional tests and uncertainty requirements<\/b><\/p>\n |