{"id":400186,"date":"2024-10-20T04:47:58","date_gmt":"2024-10-20T04:47:58","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1620-2008-3\/"},"modified":"2024-10-26T08:35:57","modified_gmt":"2024-10-26T08:35:57","slug":"ieee-1620-2008-3","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1620-2008-3\/","title":{"rendered":"IEEE 1620-2008"},"content":{"rendered":"
Revision Standard – Inactive-Reserved. This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | IEEE Std 1620-2008 Front Cover <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | Introduction Notice to users Laws and regulations Copyrights Updating of IEEE documents <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Errata Interpretations Patents <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Participants <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | Contents <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Important notice 1. Overview 1.1 Scope 1.2 Purpose <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 1.3 Electrical characterization overview <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 2. Definitions, acronyms, and abbreviations 2.1 Definitions <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 2.2 Acronyms and abbreviations 3. Standard OFET characterization procedures 3.1 Device structures <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 3.2 Guidelines for the OFET characterization process <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 3.3 Electrical standards <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 3.4 Reporting data <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 3.5 Environmental control and standards <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | Annex A (informative) Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials<\/b><\/p>\n |