{"id":421012,"date":"2024-10-20T06:33:58","date_gmt":"2024-10-20T06:33:58","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-61189-5-5032017-2\/"},"modified":"2024-10-26T12:17:30","modified_gmt":"2024-10-26T12:17:30","slug":"bs-en-iec-61189-5-5032017-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-61189-5-5032017-2\/","title":{"rendered":"BS EN IEC 61189-5-503:2017"},"content":{"rendered":"

This part of IEC 61189 specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
7<\/td>\nCONTENTS <\/td>\n<\/tr>\n
9<\/td>\nFOREWORD <\/td>\n<\/tr>\n
11<\/td>\n1 Scope
2 Normative references
3 Terms and definitions <\/td>\n<\/tr>\n
12<\/td>\n4 Testing condition
4.1 Standard condition <\/td>\n<\/tr>\n
13<\/td>\n4.2 Judgment state
5 Specimen
5.1 Outline of CAF test vehicle design
5.1.1 Evaluation design for the glass cloth direction
Figures
Figure 1 \u2013 Schematic of in-line test comb, with possible failure site <\/td>\n<\/tr>\n
14<\/td>\n5.1.2 Design between plated through hole (PTH)
Figure 2 \u2013 Schematic of staggered test comb, with possible failure site
Figure 3 \u2013 Manhattan distance <\/td>\n<\/tr>\n
15<\/td>\n5.2 CAF test board
5.2.1 Example A
Figure 4 \u2013 Schematic section of via pair with bias
Figure 5 \u2013 Example of inner layer via pads and layer patterns
Figure 6 \u2013 Example of no inner layer via pads and layer patterns <\/td>\n<\/tr>\n
16<\/td>\n5.2.2 Example B
Figure 7 \u2013 Insulation evaluation pattern for through-holes and via holes
Tables
Table 1 \u2013 Dimension of insulation evaluation pattern for through-holes <\/td>\n<\/tr>\n
17<\/td>\nFigure 8 \u2013 Layouts of the two versions of the CAF test boards
Table 2 \u2013 Test structures A1 through A4 design rules <\/td>\n<\/tr>\n
18<\/td>\n5.3 Number of specimens
6 Equipment\/Apparatus or material
6.1 Environmental test chamber
6.2 Measuring equipment
6.3 Power supply
Table 3 \u2013 Test structures B1 through B4 design rules <\/td>\n<\/tr>\n
19<\/td>\n6.4 Current limiting resistors
6.5 Connecting wire
6.6 Other dedicated fixtures
7 Resistance measurement method
7.1 Manual insulation resistance measurement method <\/td>\n<\/tr>\n
20<\/td>\n7.2 Automatic insulation resistance measurement method
Figure 9 \u2013 Measurement with insulation resistance meter <\/td>\n<\/tr>\n
21<\/td>\n8 Test method
8.1 Test method selection
8.2 Steady-state temperature and humidity test
8.2.1 Object
8.2.2 Test condition
8.3 Temperature and humidity (12 h + 12 h) cycle test
8.3.1 Object
Table 4 \u2013 Test condition <\/td>\n<\/tr>\n
22<\/td>\n8.3.2 Test condition
8.3.3 Number of cycles of the test
8.4 Temperature and humidity cyclic test with and without low temperature exposure
8.4.1 Object
8.4.2 Test condition
8.5 Steady-state high temperature and high humidity (unsaturated pressurized vapour) test
8.5.1 Object
Table 5 \u2013 Number of cycles of the test
Table 6 \u2013 Test condition <\/td>\n<\/tr>\n
23<\/td>\n8.5.2 Test condition
9 Procedure
9.1 Test specimen preparation
9.1.1 General
9.1.2 Sample identification
9.1.3 Prescreen for opens and shorts
Table 7 \u2013 Test condition (IEC 60068-2-66) <\/td>\n<\/tr>\n
24<\/td>\n9.1.4 Cleaning
9.1.5 Connecting wire
9.1.6 Cleaning after attachment
9.1.7 Dry
9.2 Precondition
9.3 Test procedure
9.3.1 Setting of the specimen
9.3.2 Test voltage and measuring voltage <\/td>\n<\/tr>\n
25<\/td>\n9.3.3 Temperature and humidity condition at the start time of the test
9.3.4 Measurement
Figure 10 \u2013 Temperature and humidity in a test <\/td>\n<\/tr>\n
26<\/td>\n9.3.5 Procedure in test interruption
9.3.6 End of test
9.4 Visual inspection
9.4.1 General
9.4.2 Shape of electrochemical migration <\/td>\n<\/tr>\n
27<\/td>\nAnnex A (informative)Forms of electrochemical migration
A.1 Example of dendrite-shaped migration
A.2 CAF (Example of migration along the glass fibre)
Figure A.1 \u2013 Example which is generated on the board surface
Figure A.2 \u2013 Example of CAF <\/td>\n<\/tr>\n
28<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Test methods for electrical materials, printed board and other interconnection structures and assemblies – General test method for materials and assemblies. Conductive anodic filaments (CAF) testing of circuit boards<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2018<\/td>\n30<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":421021,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-421012","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/421012","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/421021"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=421012"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=421012"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=421012"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}