ASTM-D3380 2010

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D3380-10 Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates

Published By	Publication Date	Number of Pages
ASTM	2010	13

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Category: ASTM

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Description

1.1 This test method permits the rapid measurement of apparent relative permittivity and loss tangent (dissipation factor) of metal-clad polymer-based circuit substrates in the X-band (8 to 12.4 GHz).

1.2 This test method is suitable for testing PTFE (polytetrafluorethylene) impregnated glass cloth or random-oriented fiber mats, glass fiber-reinforced polystyrene, polyphenyleneoxide, irradiated polyethylene, and similar materials having a nominal specimen thickness of ¹ / ₁₆ in. (1.6 mm). The materials listed in the preceding sentence have been used in commercial applications at nominal frequency of 9.6 GHz.

Note 1See Appendix X1 for additional information about range of permittivity, thickness other than 1.6 mm, and tests at frequencies other than 9.6 GHz.

1.3 The values stated in inch-pound units are to be regarded as standard. The values given in parentheses are mathematical conversions to SI units that are provided for information only and are not considered standard.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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PDF Pages	PDF Title
1	Scope Referenced Documents Terminology
2	Summary of Test Method Significance and Use Apparatus FIG. 1 FIG. 2 FIG. 3
3	FIG. 4 FIG. 5 FIG. 6 FIG. 7
4	FIG. 8 FIG. 9 FIG. 10 FIG. 11 FIG. 12
5	FIG. 13 FIG. 14 FIG. 15
6	FIG. 16 FIG. 17
7	Test Specimens Preparation of Resonator Pattern Cards FIG. 18
8	Temperature Control
9	Procedure TABLE 1
10	Calculation
11	Report Precision and Bias Keywords A1. PRECISE CALCULATIONS OF L TAKING INTO ACCOUNT THICKNESS EFFECTS UPON L A1.1 Determination of the Effect of Specimen Thickness upon L
12	X1. ADDITIONAL INFORMATION X1.1 Permittivity or ‘ X1.2 Loss Tangent, D, Dissipation Factor X1.3 Measurements at Other Frequencies X1.4 Other Metal-Clad Dielectrics X1.5 Anisotropic Materials X1.6 Soft Substrates Having High Permittivity

Additional information

Standard Title	D3380-10 Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
Published Code	ASTM
Publication Date	2010
Pages Count	13

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ASTM-D3380 2010

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