ASTM-E2444 2011

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E2444-11 Terminology Relating to Measurements Taken on Thin, Reflecting Films

Published By	Publication Date	Number of Pages
ASTM	2011	2

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Categories: 01.040.31 - Electronics (Vocabularies), ASTM

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Description

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.

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PDF Pages	PDF Title
1	Scope Referenced Documents Terminology
2	Keywords

Additional information

Standard Title	E2444-11 Terminology Relating to Measurements Taken on Thin, Reflecting Films
Published Code	ASTM
Publication Date	2011
Pages Count	2
ICS Codes	01.040.31 - Electronics (Vocabularies)

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ASTM-E2444 2011

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