Shopping Cart

No products in the cart.

ASTM-E673 2002

$40.63

E673-02a Standard Terminology Relating to Surface Analysis

Published By Publication Date Number of Pages
ASTM 2002 10
Guaranteed Safe Checkout
Categories: ,

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

ASTM E673-02a

Historical Standard: Standard Terminology Relating to Surface Analysis

ASTM E673

Scope

1.1 This terminology is related to the various disciplines involved in surface analysis.

1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).

Keywords

terminology; surface analysis

ICS Code

ICS Number Code 01.040.17 (Metrology and measurement. Physical phenomena (Vocabularies))

DOI: 10.1520/E0673-02A

ASTM-E673 2002
$40.63