Shopping Cart

No products in the cart.

ASTM-F996 2011(Redline)

$29.90

F996-11 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics (Redline)

Published By Publication Date Number of Pages
ASTM 2011 9
Guaranteed Safe Checkout
Categories: ,

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. Weā€™re here to assist you 24/7.
Email:[email protected]

Standard Title

F996-11 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics (Redline)

Published Code

ASTM

Publication Date

2011

Pages Count

9

ICS Codes 31.080.30 - Transistors
ASTM-F996 2011
$29.90