BS 6002-3:2005
$215.11
Sampling procedures for inspection by variables – Guide to double sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection
Published By | Publication Date | Number of Pages |
BSI | 2005 | 110 |
This British Standard specifies an acceptance sampling system of double sampling schemes for inspection by variables for percent nonconforming. It is indexed in terms of the acceptance quality limit (AQL).
The objectives of the methods laid down in this British Standard are to ensure that lots of acceptable quality have a high probability of acceptance and that the probability of non-accepting inferior lots is as high as practicable. This is achieved by means of the switching rules, which provide:
- automatic protection to the consumer (by means of a switch to tightened inspection or discontinuation of sampling inspection) should a deterioration in quality be detected;
- an incentive (at the discretion of the responsible authority) to reduce inspection costs (by means of a switch to a smaller sample size) should consistently good quality be achieved.
In this British Standard, the acceptability of a lot is implicitly or explicitly determined from an estimate of the percentage of nonconforming items in the process, based on either one or two random samples of items from the lot.
This British Standard is primarily designed for use under the following conditions:
- where the inspection procedure is to be applied to a continuing series of lots of discrete products all supplied by one producer using one production process. If there are different producers or production processes, this British Standard shall be applied to each one separately;
- where the items of product have a single quality characteristic (for multiple quality characteristics, see Annex A, Annex B and Annex C, which are all informative);
- where the quality characteristic is measurable on a continuous scale;
- where the measurement error is negligible (i.e. with a standard deviation no more than 10 % of the corresponding process standard deviation);
- where production is stable (under statistical control) and the quality characteristic is distributed, at least to a close approximation, according to a normal distribution;
CAUTION. The procedures in this British Standard are not suitable for application to lots that have been screened previously for nonconforming items.
- where the possibility of having to select and inspect a second sample is administratively acceptable;
- where a contract or standard defines an upper specification limit U, a lower specification limit L, or both on the quality characteristic. An item is deemed to conform if its measured quality characteristic x satisfies the appropriate one of the following inequalities:
- x ≤ U (i.e. the upper specification limit is not violated);
- x ≥ L (i.e. the lower specification limit is not violated);
- x ≤ U and x ≥ L (i.e. neither the upper nor the lower specification limit is violated).
NOTE Inequalities i) and ii) are called cases with a “single specification limit”, and iii) is the case with “double specification limits”.
For double specification limits, a further distinction is made between combined control, separate control and complex control, as follows:
- combined control is where a single AQL applies to nonconformity beyond both limits;
- separate control is where separate AQLs apply to nonconformity beyond each of the limits;
- complex control is where one AQL applies to nonconformity beyond the limit that is of greater seriousness, and a larger AQL applies to the total nonconformity beyond both limits.
PDF Catalog
PDF Pages | PDF Title |
---|---|
1 | BRITISH STANDARD |
2 | Committees responsible for this British�Standard |
3 | Contents |
9 | Introduction 1 Scope |
10 | 2 Normative references 3 Terms and definitions inspection by variables sampling inspection acceptance sampling inspection |
11 | double sampling inspection acceptance sampling inspection by variables process average acceptance quality limit quality level limiting quality nonconformity nonconforming unit “s” method acceptance sampling plan “Ö” method acceptance sampling plan |
12 | specification limit lower specification limit upper specification limit combined control separate control complex control acceptability constant quality statistic lower quality statistic upper quality statistic |
13 | maximum sample standard deviation maximum process standard deviation switching rule measurement average sample number 4 Symbols and abbreviations |
14 | 5 Acceptance quality limit (AQL) 5.1 Concept |
15 | 5.2 Use 5.3 Specifying AQLs 5.4 Preferred AQLs 5.5 Caution 5.6 Limitation 6 Switching rules for normal, tightened and reduced inspection |
16 | 7 Relation to BS�6001-1 7.1 Similarities to BS�6001-1 7.2 Differences from BS�6001-1 |
17 | 8 Limiting quality protection 8.1 Use of individual plans 8.2 Consumer’s risk quality tables 8.3 Producer’s risk tables 8.4 Operating characteristic curves 9 Planning |
18 | 10 Choice between variables and attributes 11 Choice of method 12 Choice between single and double sampling plans |
19 | 13 Choice of inspection level and AQL 14 Choice of sampling scheme 14.1 Standard schemes |
20 | 14.2 Special schemes 15 Preliminary operations 16 Standard univariate “ 16.1 Obtaining a plan, sampling and preliminary calculations |
21 | 16.2 Form |
23 | 16.3 Form |
24 | 16.4 Form |
29 | 16.5 Form 17 Standard univariate “÷” method procedures 17.1 Obtaining a plan, sampling and preliminary calculations |
30 | 17.2 Form |
32 | 17.3 Form |
33 | 17.4 Form |
34 | 17.5 Form |
35 | 18 Procedure during continuing inspection 19 Normality and outliers 19.1 Normality 19.2 Outliers |
36 | 20 Records 20.1 Control charts 20.2 Lots that are non-accepted 21 Operation of switching rules 21.1 Normal inspection 21.2 Tightened inspection 21.3 Reduced inspection |
37 | 22 Discontinuation and resumption of inspection 23 Switching between the “ 23.1 Estimating the process standard deviation 23.2 State of statistical control 23.3 Switching from the “ 23.4 Switching from the “÷” method to the “ Table 1 — Sample size code letters and inspection levels BS 6002-1. |
38 | Table 2.1 — Form k double sampling plans for normal inspection (master table) — “s” method |
39 | Table 2.2 — Form k double sampling plans for tightened inspection (master table) — “s” method |
40 | Table 2.3 — Form k double sampling plans for reduced inspection (master table) — “s” method |
41 | Table 3.1 — Form k double sampling plans for normal inspection (master table) — “Ö” method |
42 | Table 3.2 — Form k double sampling plans for tightened inspection (master table) — “Ö” method |
43 | Table 3.3 — Form k double sampling plans for reduced inspection (master table) — “Ö” method |
44 | Table 4.1 — Values of fs for maximum sample standard deviation (MSSD) for combined control of double specification limits — Normal inspection, “s” method |
45 | Table 4.2 — Values of fs for maximum sample standard deviation (MSSD) for combined control of double specification limits — Tightened inspection, “s” method |
46 | Table 4.3 — Values of fs for maximum sample standard deviation (MSSD) for combined control of double specification limits — Reduced inspection, “s” method E 1.3303 .6494 F Table 5.1 — Values of fÖ for maximum process standard deviation (MPSD) for combined control of double specification limits — “Ö” method |
47 | Table 5.2 — Values of fÖ for maximum process standard deviation ( MPSD) for separate control of double specification limits — “ Ö” method |
48 | Table 5.3 — Values of fÖ for maximum process standard deviation ( MPSD) for complex control of double specification limits — “ Ö” method |
49 | Table 6 — Estimated process average, , as a function of the quality statistic Q for sample size 3 — “s” method pˆ |
51 | Table 7.1 — Form p* double sampling plans for normal inspection (master table) — “s” method |
52 | Table 7.2 — Form p* double sampling plans for tightened inspection (master table) — “s” method |
53 | Table 7.3 — Form p* double sampling plans for reduced inspection (master table) — “s” method |
54 | Table 8.1 — Form p* double sampling plans for normal inspection (master table) — “Ö” method |
55 | Table 8.2 — Form p* double sampling plans for tightened inspection (master table) — “Ö” method |
56 | Table 8.3 — Form p* double sampling plans for reduced inspection (master table) — “O” method |
57 | Table 9 — Values of cU for upper control limit of sample standard deviation |
58 | Chart A — Sample size code letters of standard double sampling plans for specified qualities at 95 % and 50 % probabilities of acceptance |
59 | Chart C — Operating characteristic curves for double sampling plans, normal inspection — Sample size code letter C, “s” method |
60 | Chart D — Operating characteristic curves for double sampling plans, normal inspection — Sample size code letter D, “s” method |
61 | Chart E — Operating characteristic curves for double sampling plans, normal inspection — Sample size code letter E, “s” method |
62 | Chart F — Operating characteristic curves for double sampling plans, normal inspection — Sample size code letter F, “s” method |
63 | Chart G — Operating characteristic curves for double sampling plans, normal inspection — Sample size code letter G, “s” method |
64 | Chart H — Operating characteristic curves for double sampling plans, normal inspection — Sample size code letter H, “s” method |
65 | Chart J — Operating characteristic curves for double sampling plans, normal inspection — Sample size code letter J, “s” method |
66 | Chart K — Operating characteristic curves for double sampling plans, normal inspection — Sample size code letter K, “s” method |
67 | Chart L — Operating characteristic curves for double sampling plans, normal inspection — Sample size code letter L, “s” method |
68 | Chart M — Operating characteristic curves for double sampling plans, normal inspection — Sample size code letter M, “s” method |
69 | Chart N — Operating characteristic curves for double sampling plans, normal inspection — Sample size code letter N, “s” method |
70 | Chart P — Operating characteristic curves for double sampling plans, normal inspection — Sample size code letter P, “s” method |
71 | Chart Q — Operating characteristic curves for double sampling plans, normal inspection — Sample size code letter Q, “s” method |
72 | Chart R — Operating characteristic curves for double sampling plans, normal inspection — Sample size code letter R, “s” method |
73 | Annex A (informative) A.1 Standard multivariate “s” method procedures for double sampling with independent quality characteristics A.2 Procedure for a single class of nonconformity A.3 Procedure for more than one class of nonconformity |
74 | Annex B informative) B.1 Standard multivariate “O” method procedures for double sampling with independent qu… B.2 Procedure for a single class of nonconformity |
75 | B.3 Procedure for more than one class of nonconformity |
76 | Annex C (informative) Standard multivariate combined “s” and “Ö” method procedures for double sampling with independent quality characteristics C.1 General C.2 Procedure for a single class of nonconformity C.3 Procedure for more than one class of nonconformity |
77 | Annex D (informative) Location of text on key features |
78 | Annex E (normative) Estimating the process fraction nonconforming E.1 General E.2 Notation E.3 Exact formulae for a single sample of size The exact MVUE estimator of p for the “ |
79 | The exact MVUE estimator of p for the “B” method E.4 Exact formulae for a double sample with each sample of size The exact MVUE estimator of |
80 | The exact MVUE estimator of E.5 Approximative procedure for the “ |
81 | Table E.1 — Values of an |
82 | E.6 Simplified exact formula for� |
83 | E.7 Simplified exact formula for� |
84 | Annex F (informative) (informative) Form k “s” method single sampling plans matched to the corresponding single sampling plans by attributes Table F.1 Matched single sampling plans of Form |
85 | Table F.2 Matched single sampling plans of Form |
86 | Table F.3 Matched single sampling plans of Form |
87 | Annex G (informative) Form k “Ö” method single sampling plans matched to the corresponding single sampling plans by attributes Table G.1 Matched single sampling plans of Form |
88 | Table G.2 Matched single sampling plans of Form |
89 | Table G.3 Matched single sampling plans of Form |
90 | Annex H (informative) Average sample numbers for double sampling by variables:�—�“ Table H.1 Average sample numbers for double sampling under normal inspection — “ |
91 | Table H.2 Average sample numbers for double sampling under tightened�inspection — “ |
92 | Table H.3 Average sample numbers for double sampling under reduced�inspection — “ |
93 | Annex I (informative) Producer’s risks under normal inspection (in percent) — “s” method Table I.1 Producer’s risks under normal inspection (in percent) — “ |
94 | Table I.2 Producer’s risks under tightened inspection (in percent) — “ |
95 | Table I.3 Producer’s risks under reduced inspection (in percent) — “ |
96 | Annex J (informative) Tabulated operating characteristics for double sampling plans with known process st… Table J.1 Tabulated “÷” method OCs for code letter C (normal and tightened inspection) and�E (reduced inspe… Table J.2Tabulated “÷” method OCs for code letter D (normal and tightened inspection) and�F (reduced inspe… |
97 | Table J.3 Tabulated “÷” method OCs for code letter E (normal and tightened inspection) and�G (reduced inspe… Table J.4 Tabulated “÷” method OCs for code letter F (normal and tightened inspection) and�H (reduced inspe… |
98 | Table J.5 Tabulated “÷” method OCs for code letter G (normal and tightened inspection) and�J (reduced inspe… Table J.6 Tabulated “÷” method OCs for code letter H (normal and tightened inspection) and�K (reduced inspe… |
99 | Table J.7 Tabulated “÷” method OCs for code letter J (normal and tightened inspection) and�L (reduced inspe… Table J.8 Tabulated “÷” method OCs for code letter K (normal and tightened inspection) and�M (reduced inspe… |
100 | Table J.9 Tabulated “÷” method OCs for code letter L (normal and tightened inspection) and�N (reduced inspe… Table J.10 Tabulated “÷” method OCs for code letter M (normal and tightened inspection) and�P (reduced inspe… |
101 | Table J.11 Tabulated “÷” method OCs for code letter N (normal and tightened inspection) and�Q (reduced inspe… Table J.12 Tabulated “÷” method OCs for code letter P (normal and tightened inspection) and�R (reduced inspe… |
102 | Table J.13 Tabulated “÷” method OCs for code letter Q (normal and tightened inspection) Table J.14 Tabulated “÷” method OCs for code letter R (normal and tightened inspection) |
103 | Annex K (informative) Ratios of ASNs of double sampling plans under normal inspection to the sample�size … Table K.1 Minimum and maximum values of the ratios of the ASNs —� “ |
104 | Table K.2 Minimum and maximum values of the ratios of the ASNs —� “ |
105 | Annex L (informative) Ratios of the ASNs of double sampling plans by variables to the ASNs of correspondin… Table L.1 Minimum and maximum ASN ratios for normal inspection |
106 | Table L.2 Minimum and maximum ASN ratios for tightened inspection |
107 | Table L.3 Minimum and maximum ASN ratios for reduced inspection |
109 | Bibliography |