BS EN 60749-12:2002

$86.31

Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency

Published By	Publication Date	Number of Pages
BSI	2002	8

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Categories: 31.080.01 - Semiconductor devices in general, BSI

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Description

Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.

Additional information

Status	Withdrawn
Partially Replaces	BS EN 60749:1999
Title	Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency
Publisher	BSI
Committee	EPL/47
Pages	8
Publication Date	2002-09-10
Withdrawn Date	2018-04-18
Replaced By	BS EN IEC 60749-12:2018
ISBN	0 580 40333 5
Standard Number	BS EN 60749-12:2002
Identical National Standard Of	IEC 60749-12:2002, EN 60749-12 (IEC 60749-12:2002) AS
Descriptors	Vibration testing, Semiconductor devices, Integrated circuits, Electronic equipment and components, Climate, Environmental testing, Mechanical testing, Destructive testing, Frequencies, Variable
ICS Codes	31.080.01 - Semiconductor devices in general

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BS EN 60749-12:2002

$86.31


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