BS EN 62572-3:2014
$102.76
Fibre optic active components and devices. Reliability standards – Laser modules used for telecommunication
Published By | Publication Date | Number of Pages |
BSI | 2014 | 22 |
This part of IEC 62572 deals with reliability assessment of laser modules used for telecommunication.
The aim of this standard is
-
to establish a standard method of assessing the reliability of laser modules in order to minimize risks and to promote product development and reliability;
-
to establish means by which the distribution of failures with time can be determined. This should enable the determination of equipment failure rates for specified end of life criteria.
In addition, guidance is given in IEC TR 62572‑2 .
PDF Catalog
PDF Pages | PDF Title |
---|---|
6 | English CONTENTS |
7 | INTRODUCTION |
8 | 1 Scope 2 Normative references |
9 | 3 Terms, definitions, symbols and abbreviations 3.1 Terms and definitions |
10 | 3.2 Symbols and abbreviations 4 Laser reliability and quality assurance procedure 4.1 Demonstration of product quality |
11 | 4.2 Testing responsibilities 4.2.1 General 4.2.2 Recommendation applicable to laser customer/system supplier 4.2.3 Recommendation applicable to system operator 4.3 Quality improvement programmes (QIPs) 5 Tests 5.1 General |
12 | 5.2 Structural similarity 5.3 Burn-in and screening (when applicable in the specification) Tables Table 1 – Initial qualification |
14 | Table 2 – Maintenance of qualification |
15 | 6 Activities 6.1 Analysis of reliability results |
16 | 6.2 Technical visits to LMMs 6.3 Design/process changes 6.4 Deliveries 6.5 Supplier documentation Table 3 – Performance for laser module reliability parameters |
17 | Annex A (informative) Guidance on testing in Table 1 and Table 2 A.1 Laser module life tests containing thermoelectric coolers (for example, Peltier, test 1.1, Table 1) A.2 Laser module life tests – Uncooled modules (test 1.2, Table 1) Table A.1 – Recommended life test conditions for laser modulescontaining Peltier coolers |
18 | A.3 Laser diode life tests on submounts (test 1.3, Table 1) A.4 Monitor photodiode life tests (test 1.4, Table 1) Table A.2 – Recommended life test conditions for uncooled laser modules Table A.3 – Recommended laser diode life test conditions |
19 | A.5 Temperature cycling and thermal shock (test 3, Table 1 and Test 2, Table 2) A.6 Sealing/hermeticity (test 4, Table 1 and test 3, Table 2) A.7 Shock and vibration (test 5, Table 1 and test 4, Table 2) A.8 High-temperature storage (test 6, Table 1 and test 5, Table 2) Table A.4 – Recommended photodiode life test conditions |
20 | A.9 Electrostatic discharge sensitivity (ESD) (test 7, Table 1 and test 6, Table 2) A.10 Residual gas analysis (RGA) (test 8, Table 1 and test 7, Table 2) |