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BS IEC/IEEE 62704-4:2020

BS IEC/IEEE 62704-4:2020

$198.66

Determining the peak spatial-average specific absorption rate (SAR) in the human body from wireless communication devices, 30 MHz to 6 GHz – General requirements for using the finite element method for SAR calculations

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BSI 2020 52
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IEC/IEEE 62704-4:2020 describes the concepts, techniques, and limitations of the finite element method (FEM) and specifies models and procedures for verification, validation and uncertainty assessment for the FEM when used for determining the peak spatial-average specific absorption rate (psSAR) in phantoms or anatomical models. It recommends and provides guidance on the modelling of wireless communication devices, and provides benchmark data for simulating the SAR in such phantoms or models.This document does not recommend specific SAR limits because these are found elsewhere (e.g. in IEEE Std C95.1 or in the guidelines published by the International Commission on Non-Ionizing Radiation Protection (ICNIRP)). This publication is published as an IEC/IEEE Dual Logo standard.

PDF Catalog

PDF Pages PDF Title
2 undefined
4 English
CONTENTS
7 FOREWORD
9 INTRODUCTION
10 1 Scope
2 Normative references
3 Terms and definitions
11 4 Abbreviated terms
5 Finite element method – basic description
12 6 SAR calculation and averaging
6.1 General
13 6.2 SAR averaging
6.2.1 General
6.2.2 Evaluation of psSAR with an FEM mesh
14 6.3 Power scaling
7 Considerations for the uncertainty evaluation
7.1 General
15 7.2 Uncertainty due to device positioning, mesh density, and simulation parameters
7.2.1 General
Tables
Table 1 – Budget of the uncertainty contributions of the numerical algorithm and of the rendering of the test-setup or simulation-setup
16 7.2.2 Mesh convergence
7.2.3 Open boundary conditions
7.2.4 Power budget
7.2.5 Convergence of psSAR sampling
17 7.2.6 Dielectric parameters of the phantom or body model
7.3 Uncertainty and validation of the developed numerical model of the DUT
7.3.1 General
18 7.3.2 Uncertainty of the DUT model (d ≥ λ/2 or d ≥ 200 mm)
19 7.3.3 Uncertainty of the DUT model (d < λ/2 and d < 200 mm)
Table 2 – Budget of the uncertainty of the developed model of the DUT
20 7.3.4 Phantom uncertainty (d < λ/2 and d < 200 mm)
21 7.3.5 Model validation
7.4 Uncertainty budget
22 8 Code verification
8.1 General
8.1.1 Rationale
Table 3 – Overall assessment uncertainty budget for the numerical simulation results
23 8.1.2 Code performance verification
8.1.3 Canonical benchmarks
8.2 Code performance verification
8.2.1 Propagation in a rectangular waveguide
26 Figures
Figure 1 – Waveguide filled half with free-space (green) and half with dielectric (blue)
27 Figure 2 – Aligned rectangular waveguide and locations of the sample points E01, E10, E11, E12 and E21 at which the Ex components are recorded
Table 4 – Results of the evaluation of the numerical dispersion characteristicsto be reported for each mesh axis and each orientation of the waveguide for at least three increasing numbers of DoF
28 8.2.2 Planar dielectric boundaries
29 Table 5 – Results of the evaluation of the numerical reflection coefficientto be reported; frequency range is indicated for each value to be reported
30 8.2.3 Open boundary conditions
8.3 Weak patch test
8.3.1 General
31 8.3.2 Free-space weak patch test
Figure 3 – Weak patch test arrangement: a free-space cubewith edge length L illuminated by a plane wave
32 Table 6 – Guiding parameters for coarse and fine mesh generationfor the weak patch test
34 Table 7 – Results of the evaluation of the error measures on the control meshfor the weak patch test for the lowest order
Table 8 – Results of the evaluation of the error measures on the control mesh for the weak patch test for the second lowest order
35 8.3.3 Dielectric-layer weak patch test
Figure 4 – Dielectric-layer weak patch test arrangement
Table 9 – Results of the evaluation of the error measures on the control meshfor the weak patch test for the third lowest order
36 Table 10 – Guiding parameters for coarse and fine mesh generationfor the dielectric-layered weak patch test
37 Table 11 – Results of the evaluation of error measures on the control meshfor the dielectric-layered weak patch test for the lowest order
Table 12 – Results of the evaluation of error measures on the control mesh for the dielectric-layered weak patch test for the second lowest order
38 8.4 Verification of the psSAR calculation
8.5 Canonical benchmarks
8.5.1 Mie sphere
Table 13 – Results of the evaluation of error measures on the control mesh for the dielectric-layered weak patch test for the third lowest order
39 8.5.2 Generic dipole
Table 14 – Results of the SAR evaluation of the Mie sphere
40 8.5.3 Microstrip terminated with open boundary conditions
Figure 5 – Geometry of the microstrip line
Table 15 – Results of the dipole evaluation
41 8.5.4 psSAR calculation SAM phantom / generic phone
8.5.5 Setup for system performance check
Table 16 – Results of the microstrip evaluation
Table 17 – 1 g and 10 g psSAR for the SAM phantom exposed tothe generic phone for 1 W accepted power as specified in [19]
42 Figure 6 – Geometry of the setup for thesystem performance check according to [21]
Table 18 – Dielectric parameters of the setup (Table 1 of [21])
Table 19 – Mechanical parameters of the setup (Tables 1 and 2 of [21])
Table 20 – 1 g and 10 g psSAR normalized to 1 W accepted powerand feed-point impedance (Table 3 and Table 4 of [21])
43 Annex A (informative)Fundamentals of the finite element method
A.1 General
A.2 Model boundary value problem
44 A.3 Galerkin weak form
A.4 Finite element approximation
45 A.5 Considerations for using FEM
46 Annex B (informative)File format for field and SAR data
47 Annex C (informative)Analytical solution for error calculationin weak patch-test problems
C.1 Generation of control mesh and FEM field values
C.2 Free-space weak patch test
C.3 Dielectric-layer weak patch test
50 Bibliography

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BS IEC/IEEE 62704-4:2020
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