BSI 24/30485839 DC 2024
$13.70
BS EN IEC 61987-41 IEC 61987 – Part 41: Generic structures of List of Properties (LOP) of Process Analyzer Technology (PAT) measuring devices for electronic data exchange
Published By | Publication Date | Number of Pages |
BSI | 2024 | 24 |
PDF Catalog
PDF Pages | PDF Title |
---|---|
7 | FOREWORD |
9 | INTRODUCTION |
11 | 1 Scope 2 Normative references 3 Terms and definitions |
12 | 3.1 Dynamic property 3.2 List of Properties for Dynamic Data (LOPD) 4 General 4.1 Characterization scheme 4.2 OLOP, DLOP and LOPD |
13 | 4.3 Cardinality and polymorphism |
14 | 5 Operating List of Properties (OLOP) 5.1 Generic block structure 5.2 Matrix of components/measurands 5.2.1 Chemical component/measurand 5.2.1.1 Process analyser measurands |
15 | 5.3 Measuring or control point 5.4 Base conditions 5.5 Physical properties at sampling point 5.6 Operating conditions for device design 5.7 Process equipment 5.8 Physical location 5.8.1 General 5.8.2 Available power supply 5.8.3 Purge gas supply |
16 | 5.8.4 Process criticality classification 5.8.5 Area classification 5.9 Auxiliary media 6 Device List of Properties (DLOP) 6.1 Basic structure 6.1.1 General 6.1.2 Generic block structure |
18 | 6.1.3 Relationship to IEC 61987-10F 7 LOPD with dynamic properties for condition monitoring 7.1 General |
19 | 7.2 Measurement variables 7.3 General device variables/status 7.4 Specific device variables/status/condition monitoring 7.5 General device parameters and variables 7.6 General functions 8 Additional aspects |
20 | Annex A (informative) Device Type Dictionary – Classification of process analysers |
24 | Bibliography |