IEEE 1671.3-2017

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IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description

Published By	Publication Date	Number of Pages
IEEE	2017

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Description

Revision Standard – Active. An exchange format utilizing Extensible Markup Language (XML) for both the static description of unit under test (UUT) and the specific description of UUT instance information is defined in this standard.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std 1671.3™-2017 Front Cover
2	Title page
4	Important Notices and Disclaimers Concerning IEEE Standards Documents
7	Participants
8	Introduction
9	Contents
10	1. Overview 1.1 Scope 1.2 Application
11	1.3 Conventions used within this document
12	2. Normative references
13	3. Definitions, acronyms, and abbreviations 3.1 Definitions
14	3.2 Acronyms and abbreviations
15	4. UUTDescription schema 4.1 Applicability 4.2 Describing UUT hierarchy 4.3 Using the hc:HardwareItemDescription type in the UUTDescription schema
23	4.4 Describing UUT digital serial buses 5. UUTInstance schema 5.1 Applicability
24	5.2 Describing UUT instance hierarchy 6. ATML UUT Description XML schema names and locations
25	7. ATML XML schema extensibility
26	8. Conformance
27	Annex A (normative) XML schemas A.1 UUTDescription XML schema
80	A.2 UUTInstance XML schema
89	Annex B (informative) IEEE download website material associated with this document
90	Annex C (informative) Describing UUT serial digital buses
91	C.1 Describing serial buses
93	C.2 Describing serial bus nodes
95	C.3 Describing serial bus messages
100	Annex D (informative) User information and examples D.1 Line-replaceable unit UUT
101	D.2 Circuit card assembly UUT
102	D.3 UUTInstance D.4 Description of digital serial buses
103	Annex E (informative) Bibliography
104	Back Cover