IEEE TestSuiteSpecification:Synchrophasor 2015
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IEEE Synchrophasor Measurement Test Suite Specification
| Published By | Publication Date | Number of Pages |
| IEEE | 2015 | 44 |
– Active. The test suite specification (TSS) provides organizations that are testing phasor measurement unit (PMU) performance with a suite of unambiguous test plans
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEEE Synchrophasor Measurement Test Suite Specification |
| 3 | Title page |
| 5 | Notice and Disclaimer of Liability Concerning the Use of IEEE Conformity Assessment Program Documents |
| 6 | Authors Reviewers |
| 7 | Contents |
| 8 | 1. Purpose 2. Scope |
| 9 | 3. Normative references 4. PMU features 4.1 Required features 4.1.1 Reporting rates 4.1.2 Performance class 4.2 Optional features 4.2.1 Reporting rates |
| 10 | 4.2.2 Multiple data transmissions 4.2.3 Time synchronization source accepted 4.2.4 Multifunction devices (such as digital fault recorders) that are designed to tolerate transient currents and voltages 5. Test case reference list |
| 11 | 6. Test equipment capabilities 6.1 Calibration device components 6.2 Timing reference |
| 12 | 6.3 Signal source(s) |
| 13 | 6.3.1 Signal sources for steady-state tests 6.3.2 Signal sources for dynamic tests 6.4 PMU measurement receiver 6.4.1 Physical media |
| 14 | 6.4.2 Protocols 6.5 Reference (“true”) values and result calculation |
| 15 | 6.6 Environmental conditions 6.7 Test uncertainty ratio |
| 18 | 7. Test result calculations 7.1 Total vector error (TVE) 7.2 Magnitude error (ME) and phase error (PE) 7.2.1 Magnitude error (ME) (percent) 7.2.2 Phase error (PE) (degrees) 7.3 Frequency error (FE) |
| 19 | 7.4 Rate of change of frequency error (RFE) |
| 20 | 7.5 Step response time 7.5.1 Ambiguity in the step response time 7.6 Step delay time 7.7 Step overshoot/undershoot 7.8 PMU reporting latency |
| 21 | 8. Test plans 8.1 Signal frequency range 8.1.1 Special environmental conditions 8.1.2 Test plan for signal frequency range |
| 22 | 8.1.3 Signal frequency range test ambiguities 8.2 Signal magnitude 8.2.1 Test plan for signal magnitude—voltage and current 8.2.2 Signal magnitude test ambiguities 8.3 Phase angle |
| 23 | 8.3.1 Test plan for phase angle 8.3.2 Phase angle test ambiguities 8.4 Harmonic distortion 8.4.1 Test plan for harmonic distortion |
| 24 | 8.4.2 Harmonic distortion test ambiguities 8.5 Out-of-band interfering signals |
| 25 | 8.5.1 Test plan for out-of-band interfering signals |
| 26 | 8.5.2 Out-of-band interfering signals test ambiguities 8.5.2.1 Unspecified increments of out-of-band signals |
| 27 | 8.5.2.2 Unspecified increments of input test signal frequency 8.5.2.3 Suspension of the ROCOF error limits 8.6 Measurement bandwidth 8.6.1 Test plan for measurement bandwidth |
| 28 | 8.6.2 Measurement bandwidth test ambiguities 8.7 Ramp of system frequency |
| 29 | 8.7.1 Test plan for ramp of system frequency |
| 30 | 8.7.2 Ambiguities in the test during ramp of system frequency 8.8 Step changes in phase and magnitude |
| 32 | 8.8.2 Test plan for step change in phase and magnitude |
| 33 | 8.8.3 Step change in phase and magnitude test ambiguities 8.8.3.1 Reference level for overshoot 8.8.3.2 Response time and delay time 8.9 PMU reporting latency compliance testing |
| 34 | 8.9.1 Test plan for measurement latency 8.9.2 Measurement latency test ambiguities 8.9.2.1 Slow latency drift 8.9.2.2 Temperature testing of latency |
| 35 | 9. Test reporting 9.1 Required documentation 9.1.1 Performance class 9.1.2 Measurements that meet this class of performance 9.1.3 Test results demonstrating performance 9.1.3.1 Steady-state signal frequency range tests 9.1.3.2 Steady-state signal magnitude tests |
| 36 | 9.1.3.3 Steady-state harmonic distortion tests 9.1.3.4 Steady-state out-of-band interfering signals tests 9.1.3.5 Dynamic measurement bandwidth tests |
| 37 | 9.1.3.6 Dynamic ramp of system frequency tests 9.1.3.7 Dynamic step changes in phase and magnitude tests 9.1.3.8 PMU latency |
| 38 | 9.1.4 PMU under test settings 9.1.5 Equipment and equipment settings that were used in testing 9.1.5.1 Timing source(s) 9.1.5.2 Nominal frequency 9.1.5.3 Nominal voltage 9.1.5.4 Nominal current 9.1.5.5 Reporting rate 9.1.5.6 Calibration date 9.1.6 Environmental conditions during testing 9.1.7 Test equipment TUR when less than 10:1 |
| 39 | 10. PMU calibrator calibration 10.1 Calibration requirements for a PMU calibration system 10.1.1 Analog signal source magnitude and absolute phase 10.1.2 “True” (reference) value uncertainty 10.1.3 Result calculations 10.2 Performance limits for PMU calibrators 10.2.1 Test uncertainty ratio (TUR) 10.2.2 Test signal total harmonic distortion 10.2.2.1 Ambiguity in THD limit |
| 40 | 10.3 PMU calibrator calibration methodology 10.3.1 Direct measurement 10.3.2 Transfer calibration |
| 41 | Annex A (informative)Acronyms, abbreviations, and symbols |
| 43 | Annex B (informative) Bibliography |
| 44 | Back Cover |
