{"id":233897,"date":"2024-10-19T15:15:15","date_gmt":"2024-10-19T15:15:15","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-60749-52017\/"},"modified":"2024-10-25T09:46:24","modified_gmt":"2024-10-25T09:46:24","slug":"bs-en-60749-52017","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-60749-52017\/","title":{"rendered":"BS EN 60749-5:2017"},"content":{"rendered":"<p>This part of <span class=\"std\"> <span class=\"std-ref\">IEC&nbsp;60749<\/span> <\/span> provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.<\/p>\n<p>This test method is considered destructive.<\/p>\n<h4>PDF Catalog<\/h4>\n<table border=\"1px\" class=\"des-table\">\n<tr>\n<th>PDF Pages<\/th>\n<th>PDF Title<\/th>\n<\/tr>\n<tr>\n<td><b>2<b><\/td>\n<td>National foreword  <\/td>\n<\/tr>\n<tr>\n<td><b>7<b><\/td>\n<td>CONTENTS  <\/td>\n<\/tr>\n<tr>\n<td><b>8<b><\/td>\n<td>FOREWORD  <\/td>\n<\/tr>\n<tr>\n<td><b>10<b><\/td>\n<td>1 Scope <br \/> 2 Normative references <br \/> 3 Terms and definitions <br \/> 4 General  <\/td>\n<\/tr>\n<tr>\n<td><b>11<b><\/td>\n<td>5 Equipment <br \/> 5.1 Equipment summary <br \/> 5.2 Temperature and relative humidity <br \/> 5.3 Devices under stress <br \/> 5.4 Minimizing release of contamination <br \/> 5.5 Ionic contamination <br \/> 5.6 Deionized water <br \/> 6 Test conditions <br \/> 6.1 Test conditions summary <br \/> 6.2 Temperature, relative humidity and duration <br \/> Table 1 \u2013 Temperature, relative humidity and duration  <\/td>\n<\/tr>\n<tr>\n<td><b>12<b><\/td>\n<td>6.3 Biasing guidelines <br \/> 6.4 Biasing choice and reporting  <\/td>\n<\/tr>\n<tr>\n<td><b>13<b><\/td>\n<td>7 Procedures <br \/> 7.1 Mounting <br \/> 7.2 Ramp-up <br \/> 7.3 Ramp-down <br \/> 7.4 Test clock <br \/> 7.5 Bias <br \/> 7.6 Read-out <br \/> Table 2 \u2013 Criteria for choosing continuous or cyclical bias  <\/td>\n<\/tr>\n<tr>\n<td><b>14<b><\/td>\n<td>7.7 Handling <br \/> 8 Failure criteria <br \/> 9 Safety <br \/> 10 Summary  <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"<p><b>Semiconductor devices. Mechanical and climatic test methods &#8211; Steady-state temperature humidity bias life test<\/b><\/p>\n<table class=\"shortdes-table\" style=\"width: 100%\" border=\"0\" cellspacing=\"0\" cellpadding=\"0\">\n<tbody>\n<tr>\n<td>Published By<\/td>\n<td>Publication Date<\/td>\n<td>Number of Pages<\/td>\n<\/tr>\n<tr>\n<td><a href=\"https:\/\/pdfstandards.shop\/product-category\/publishers\/bsi\/\"><b>BSI<\/b><\/a><\/td>\n<td>2017<\/td>\n<td>16<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":233901,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[573,2641],"product_tag":[],"class_list":{"0":"post-233897","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-080-01","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/233897","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/233901"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=233897"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=233897"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=233897"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}