{"id":389886,"date":"2024-10-20T03:52:04","date_gmt":"2024-10-20T03:52:04","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iec-tr-633672021\/"},"modified":"2024-10-26T07:06:41","modified_gmt":"2024-10-26T07:06:41","slug":"bsi-pd-iec-tr-633672021","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iec-tr-633672021\/","title":{"rendered":"BSI PD IEC TR 63367:2021"},"content":{"rendered":"

This document summarises the results of a round robin on connector end face scratch recognition and verification by automated microscopes. The prime objectives of the study were:<\/p>\n